Inventor

SCHUELER BRUNO W

US19 patents

⚠️ This page may combine multiple inventors who share the name “SCHUELER BRUNO W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SCHUELER BRUNO W

NOVA MEASURING INSTR INC

Methods and systems for measuring periodic structures using multi-angle x-ray reflectance scatterometry (XRS)

Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)

Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

Patterned x-ray emitting target

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

System and method for measuring a sample by x-ray reflectance scatterometry

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

REVERA INC

Method and system for calibrating an X-ray photoelectron spectroscopy measurement

Photoelectron spectroscopy apparatus and method of use

POIS HEATH A

Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)

CHARLES EVANS & ASSOCIATES

Particle analyzer apparatus and method

(unassigned)

Focused ion beam column with electrically variable blanking aperture

SCHUELER BRUNO W

System and method for characterizing a film by X-ray photoelectron and low-energy X-ray fluorescence spectroscopy

FANTON JEFFREY T

Methods and systems for fabricating platelets of a monochromator for X-ray photoelectron spectroscopy