Inventor
DAWSON CHAD S
US27 patents
⚠️ This page may combine multiple inventors who share the name “DAWSON CHAD S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
16 patentsUS9663350B2May 30, 2017
Stress isolated differential pressure sensor
FREESCALE SEMICONDUCTOR INC4 citations73
US9638712B2May 2, 2017
MEMS device with over-travel stop structure and method of fabrication
FREESCALE SEMICONDUCTOR INC3 citations73
US9446940B2Sep 20, 2016
Stress isolation for MEMS device
FREESCALE SEMICONDUCTOR INC6 citations73
US9285289B2Mar 15, 2016
Pressure sensor with built-in calibration capability
FREESCALE SEMICONDUCTOR INC4 citations72
US9829406B2Nov 28, 2017
Differential capacitive output pressure sensor and method
FREESCALE SEMICONDUCTOR INC3 citations71
US9791340B2Oct 17, 2017
Self test for capacitive pressure sensors
FREESCALE SEMICONDUCTOR INC5 citations71
US9458008B1Oct 4, 2016
Method of making a MEMS die having a MEMS device on a suspended structure
FREESCALE SEMICONDUCTOR INC3 citations68
US9346671B2May 24, 2016
Shielding MEMS structures during wafer dicing
FREESCALE SEMICONDUCTOR INC2 citations62
US10295559B2May 21, 2019
Accelerometer calibration in a rotating member
FREESCALE SEMICONDUCTOR INC1 citations56
US9714879B2Jul 25, 2017
Electrically conductive barriers for integrated circuits
FREESCALE SEMICONDUCTOR INC0 citations52
US9540227B2Jan 10, 2017
Inhibiting propagation of surface cracks in a MEMS device
FREESCALE SEMICONDUCTOR INC0 citations51
US9488542B2Nov 8, 2016
Pressure sensor having multiple pressure cells and sensitivity estimation methodology
FREESCALE SEMICONDUCTOR INC0 citations51
US9176020B2Nov 3, 2015
Pressure sensor having multiple pressure cells and sensitivity estimation methodology
FREESCALE SEMICONDUCTOR INC0 citations51
US9102514B2Aug 11, 2015
Inhibiting propagation of surface cracks in a MEMS Device
FREESCALE SEMICONDUCTOR INC0 citations51
US9546925B2Jan 17, 2017
Packaged sensor with integrated offset calibration
FREESCALE SEMICONDUCTOR INC1 citations45
US9285404B2Mar 15, 2016
Test structure and methodology for estimating sensitivity of pressure sensors
FREESCALE SEMICONDUCTOR INC0 citations40
DAWSON CHAD S
7 patentsUS8245562B2Aug 21, 2012
Circuit and method for pressure sensor testing
DAWSON CHAD S8 citations83
US9417146B2Aug 16, 2016
Sensor device and related operating methods
DAWSON CHAD S3 citations72
US8921952B2Dec 30, 2014
Microelectromechanical system devices having crack resistant membrane structures and methods for the fabrication thereof
DAWSON CHAD S5 citations71
US9927266B2Mar 27, 2018
Multi-chip device with temperature control element for temperature calibration
DAWSON CHAD S2 citations67
US9926187B2Mar 27, 2018
Microelectromechanical system devices having crack resistant membrane structures and methods for the fabrication thereof
DAWSON CHAD S0 citations51
US9285422B2Mar 15, 2016
Tester and method for testing a strip of devices
DAWSON CHAD S1 citations51
US8922227B2Dec 30, 2014
Systems and methods for detecting surface charge
DAWSON CHAD S0 citations50