P

Inventor

WANG MING-FANG

TW27 patents
⚠️ This page may combine multiple inventors who share the name “WANG MING-FANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

17 patents
US6656764B1Dec 2, 2003

Process for integration of a high dielectric constant gate insulator layer in a CMOS device

TAIWAN SEMICONDUCTOR MFG111 citations99
US6706581B1Mar 16, 2004

Dual gate dielectric scheme: SiON for high performance devices and high k for low power devices

TAIWAN SEMICONDUCTOR MFG78 citations97
US6890811B2May 10, 2005

Dual gate dielectric scheme: SiON for high performance devices and high k for low power devices

TAIWAN SEMICONDUCTOR MFG63 citations95
US6455330B1Sep 24, 2002

Methods to create high-k dielectric gate electrodes with backside cleaning

TAIWAN SEMICONDUCTOR MFG51 citations93
US7071066B2Jul 4, 2006

Method and structure for forming high-k gates

TAIWAN SEMICONDUCTOR MFG46 citations92
US7030024B2Apr 18, 2006

Dual-gate structure and method of fabricating integrated circuits having dual-gate structures

TAIWAN SEMICONDUCTOR MFG31 citations92
US7087480B1Aug 8, 2006

Process to make high-k transistor dielectrics

TAIWAN SEMICONDUCTOR MFG15 citations89
US7303996B2Dec 4, 2007

High-K gate dielectric stack plasma treatment to adjust threshold voltage characteristics

TAIWAN SEMICONDUCTOR MFG14 citations81
US8012824B2Sep 6, 2011

Process to make high-K transistor dielectrics

TAIWAN SEMICONDUCTOR MFG5 citations74
US6914313B2Jul 5, 2005

Process for integration of a high dielectric constant gate insulator layer in a CMOS device

TAIWAN SEMICONDUCTOR MFG8 citations74
US6780788B2Aug 24, 2004

Methods for improving within-wafer uniformity of gate oxide

TAIWAN SEMICONDUCTOR MFG12 citations74
US6764927B1Jul 20, 2004

Chemical vapor deposition (CVD) method employing wetting pre-treatment

TAIWAN SEMICONDUCTOR MFG9 citations72
US7393766B2Jul 1, 2008

Process for integration of a high dielectric constant gate insulator layer in a CMOS device

TAIWAN SEMICONDUCTOR MFG2 citations63
US7018879B2Mar 28, 2006

Method of making an ultrathin silicon dioxide gate with improved dielectric properties using NH3 nitridation and post-deposition rapid thermal annealing

TAIWAN SEMICONDUCTOR MFG4 citations63
US7351994B2Apr 1, 2008

Noble high-k device

TAIWAN SEMICONDUCTOR MFG2 citations62
US7271450B2Sep 18, 2007

Dual-gate structure and method of fabricating integrated circuits having dual-gate structures

TAIWAN SEMICONDUCTOR MFG3 citations62
US7037816B2May 2, 2006

System and method for integration of HfO2 and RTCVD poly-silicon

TAIWAN SEMICONDUCTOR MFG2 citations53

KUAN HSINGS ENTPR CORP

4 patents

SUPERIOR CROWN MAT CO LTD

2 patents

(unassigned)

1 patent

WANG MING-FANG

1 patent

HOU TOU-HUNG

1 patent

YAO LIANG-GI

1 patent