Inventor
KOHASHI TERUO
JP14 patents
⚠️ This page may combine multiple inventors who share the name “KOHASHI TERUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
8 patentsUS7755046B2Jul 13, 2010
Transmission electron microscope
HITACHI LTD9 citations83
US11163974B2Nov 2, 2021
Image acquisition system and image acquisition method
HITACHI LTD2 citations71
US10395885B2Aug 27, 2019
Charged particle device, charged particle irradiation method, and analysis device
HITACHI LTD2 citations71
US10304657B2May 28, 2019
Mirror ion microscope and ion beam control method
HITACHI LTD1 citations62
US8022364B2Sep 20, 2011
Electron spin detector, and spin polarized scanning electron microscope and spin-resolved x-ray photoelectron spectroscope using the electron spin detector
HITACHI LTD4 citations60
US10210962B2Feb 19, 2019
Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating
HITACHI LTD1 citations55
US7985952B2Jul 26, 2011
Charged particle spin polarimeter, microscope, and photoelectron spectroscope
HITACHI LTD0 citations50
US11587226B2Feb 21, 2023
Magnetic domain image processing apparatus and magnetic domain image processing method
HITACHI LTD0 citations49
HITACHI HIGH TECH CORP
5 patentsUS11170972B2Nov 9, 2021
Scanning electron microscope and method for analyzing secondary electron spin polarization
HITACHI HIGH TECH CORP2 citations71
US12400827B2Aug 26, 2025
Charged particle beam device
HITACHI HIGH TECH CORP0 citations61
US11756763B2Sep 12, 2023
Scanning electron microscope
HITACHI HIGH TECH CORP0 citations61
US11139143B2Oct 5, 2021
Spin polarimeter
HITACHI HIGH TECH CORP0 citations61
US11961699B2Apr 16, 2024
Charged particle beam device
HITACHI HIGH TECH CORP0 citations51