Inventor

CHEN FREDERICK

TW43 patents

⚠️ This page may combine multiple inventors who share the name “CHEN FREDERICK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHEN FREDERICK

WINBOND ELECTRONICS CORP

RRAM device and method for manufacturing the same

Resistive random access memory

Resistive memory apparatus and writing method thereof

Three-dimensional resistive memories and methods for forming the same

RRAM device and method for manufacturing the same

RRAM device and method for manufacturing the same

Resistance change memory device and fabrication method thereof

Data read method and a non-volatile memory apparatus using the same

Three-dimensional resistive memory

Resistive random access memory

Writing method for resistive memory cell and resistive memory

Resistive random access memory

Resistive memory and method of fabricating the same

Resistive random access memory

Writing method for resistive memory apparatus

Memory device

Resistive memory apparatus

Memory device and method of manufacturing the same

Write method for resistive memory

Resistive memory

Patterning method

Method of fabricating resistive memory

Data write-in method and non-volatile memory

Resistive memory device and reliability enhancement method thereof by using ratio of set current and reference current

Writing method for resistive memory cell and resistive memory

Semiconductor device and method of forming the same

Memory device with increased density and method of fabricating the same

Method of forming a semiconductor device

Resistive random access memory devices and methods for forming the same

Resistance change memory device and fabrication method thereof

Semiconductor device and method of fabricating the same

Resistive memory apparatus

Filament forming method for resistive memory unit

Circuit and method for memory operation

One-time-programmable resistive random access memory and method for forming the same

Resistive memory and operating method for performing a forming operation thereof

Resistive memory apparatus and reading method thereof

Synapse system and synapse method to realize STDP operation

Resistive random access memory having selector and current limiter structures

INTEL CORP

Photomask frame modification to eliminate process induced critical dimension control variation

Photomask frame modification to eliminate process induced critical dimension control variation

Advanced mask patterning with patterning layer

MA JIAN

Advanced mask patterning with patterning layer