P

Inventor

CHENG FAN-TIEN

TW36 patents
⚠️ This page may combine multiple inventors who share the name “CHENG FAN-TIEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNIV NAT CHENG KUNG

29 patents
US7493185B2Feb 17, 2009

Quality prognostics system and method for manufacturing processes

UNIV NAT CHENG KUNG56 citations96
US7593912B2Sep 22, 2009

Method for evaluating reliance level of a virtual metrology system in product manufacturing

UNIV NAT CHENG KUNG22 citations87
US7457236B2Nov 25, 2008

Method for providing fault-tolerant application cluster service

UNIV NAT CHENG KUNG28 citations86
US7162394B2Jan 9, 2007

Generic embedded device and mechanism thereof for various intelligent-maintenance applications

UNIV NAT CHENG KUNG10 citations83
US7603328B2Oct 13, 2009

Dual-phase virtual metrology method

UNIV NAT CHENG KUNG14 citations81
US8862525B2Oct 14, 2014

Method for screening samples for building prediction model and computer program product thereof

UNIV NAT CHENG KUNG4 citations71
US7386751B2Jun 10, 2008

Generic service management system

UNIV NAT CHENG KUNG7 citations71
US10618137B2Apr 14, 2020

Automated constructing method of cloud manufacturing service and cloud manufacturing system

UNIV NAT CHENG KUNG3 citations69
US9508042B2Nov 29, 2016

Method for predicting machining quality of machine tool

UNIV NAT CHENG KUNG4 citations69
US10269660B2Apr 23, 2019

Metrology sampling method with sampling rate decision scheme and computer program product thereof

UNIV NAT CHENG KUNG2 citations65
US10242319B2Mar 26, 2019

Baseline predictive maintenance method for target device and computer program product thereof

UNIV NAT CHENG KUNG5 citations65
US9829415B2Nov 28, 2017

Metrology sampling method and computer program product thereof

UNIV NAT CHENG KUNG2 citations63
US10695884B2Jun 30, 2020

Tool wear monitoring and predicting method

UNIV NAT CHENG KUNG1 citations61
US11378946B2Jul 5, 2022

Predictive maintenance method for component of production tool and computer program product thererof

UNIV NAT CHENG KUNG1 citations60
US11679565B2Jun 20, 2023

Additive manufacturing system and method and feature extraction method

UNIV NAT CHENG KUNG0 citations59
US11673339B2Jun 13, 2023

Additive manufacturing system and method and feature extraction method

UNIV NAT CHENG KUNG0 citations59
US11383450B2Jul 12, 2022

Additive manufacturing system and method and feature extraction method

UNIV NAT CHENG KUNG0 citations59
US11383446B2Jul 12, 2022

Additive manufacturing system and method and feature extraction method

UNIV NAT CHENG KUNG0 citations59
US12228921B2Feb 18, 2025

Multiple-variable predictive maintenance method for component of production tool and non-transitory tangible computer readable recording medium thereof

UNIV NAT CHENG KUNG0 citations50
US10948903B2Mar 16, 2021

System and method that consider tool interaction effects for identifying root causes of yield loss

UNIV NAT CHENG KUNG0 citations50
US12481879B2Nov 25, 2025

Virtual metrology method based on convolutional autoencoder and transfer learning and system thereof

UNIV NAT CHENG KUNG0 citations49
US11745267B2Sep 5, 2023

Additive manufacturing method

UNIV NAT CHENG KUNG0 citations47
US12586082B2Mar 24, 2026

Hybrid system and method of carbon and energy managements for green intelligent manufacturing

UNIV NAT CHENG KUNG0 citations46
US12355244B2Jul 8, 2025

Hybrid system and method for distributed virtual power plants integrated intelligent net zero

UNIV NAT CHENG KUNG0 citations46
US11829124B2Nov 28, 2023

Method for predicting occurrence of tool processing event and virtual metrology application and computer program product thereof

UNIV NAT CHENG KUNG0 citations43
US12354122B2Jul 8, 2025

Golden path search method for manufacturing process and system thereof

UNIV NAT CHENG KUNG0 citations42
US11921474B2Mar 5, 2024

Virtual metrology method using convolutional neural network and computer program product thereof

UNIV NAT CHENG KUNG0 citations42
US10935962B2Mar 2, 2021

System and method for identifying root causes of yield loss

UNIV NAT CHENG KUNG0 citations42
US10345794B2Jul 9, 2019

Product quality prediction method for mass customization

UNIV NAT CHENG KUNG0 citations38

CHENG FAN-TIEN

3 patents

TAIWAN SEMICONDUCTOR MFG

1 patent

NAT SCIENCE COUNCIL

1 patent

Chen ying-liang

1 patent

YANG YU-CHUNG

1 patent