Inventor
KIMIZUKA NAOHIKO
JP25 patents
⚠️ This page may combine multiple inventors who share the name “KIMIZUKA NAOHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC ELECTRONICS CORP
8 patentsUS6853037B2Feb 8, 2005
Fabrication of low power CMOS device with high reliability
NEC ELECTRONICS CORP27 citations92
US6756635B2Jun 29, 2004
Semiconductor substrate including multiple nitrided gate insulating films
NEC ELECTRONICS CORP42 citations88
US7030464B2Apr 18, 2006
Semiconductor device and method of manufacturing the same
NEC ELECTRONICS CORP9 citations73
US7759744B2Jul 20, 2010
Semiconductor device having high dielectric constant layers of different thicknesses
NEC ELECTRONICS CORP4 citations62
US7754570B2Jul 13, 2010
Semiconductor device
NEC ELECTRONICS CORP2 citations62
US7033918B2Apr 25, 2006
Semiconductor device including p-channel type transistor, and production method for manufacturing such semiconductor device
NEC ELECTRONICS CORP0 citations52
US6969876B2Nov 29, 2005
Semiconductor device including p-channel type transistor, and production method for manufacturing such semiconductor device
NEC ELECTRONICS CORP0 citations52
US7102183B2Sep 5, 2006
MOS transistor
NEC ELECTRONICS CORP0 citations41
SONY SEMICONDUCTOR SOLUTIONS CORP
8 patentsUS12136635B2Nov 5, 2024
Imaging element and imaging device with selection and amplication transistor gates formed on same silicon channel
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations62
US12046605B2Jul 23, 2024
Imaging element and imaging device
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations62
US11350050B2May 31, 2022
Semiconductor integrated circuit and imaging device
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations62
US12163992B2Dec 10, 2024
Charge detection sensor and potential measurement system
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations58
US11754610B2Sep 12, 2023
Charge detection sensor and potential measurement system
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations58
US12349441B2Jul 1, 2025
Semiconductor device and semiconductor device manufacturing method, and image capturing device
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations51
US11906563B2Feb 20, 2024
Electric potential measuring device and method for manufacturing electric potential measuring device
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations51
US12136640B2Nov 5, 2024
Solid-state imaging device
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations46
NEC CORP
7 patentsUS6664148B2Dec 16, 2003
Integrated circuit device with switching between active mode and standby mode controlled by digital circuit
NEC CORP7 citations73
US6388504B1May 14, 2002
Integrated circuit device with switching between active mode and standby mode controlled by digital circuit
NEC CORP12 citations73
US6013577AJan 11, 2000
Method of making an amorphous surface for a gate electrode during the fabrication of a semiconductor device
NEC CORP7 citations73
US6001737ADec 14, 1999
Method of forming a semiconductor device having a titanium salicide shallow junction diffusion layer
NEC CORP9 citations73
US5877082AMar 2, 1999
Method of manufacturing semiconductor device without plasma damage
NEC CORP6 citations63
US7238996B2Jul 3, 2007
Semiconductor device
NEC CORP4 citations62
US6380594B1Apr 30, 2002
Semiconductor device
NEC CORP3 citations62