Inventor
WADA YUKIHISA
JP44 patents
⚠️ This page may combine multiple inventors who share the name “WADA YUKIHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NGK INSULATORS LTD
14 patentsUS7029511B2Apr 18, 2006
Si-containing honeycomb structure and process for production thereof
NGK INSULATORS LTD27 citations92
US5262102ANov 16, 1993
Process for firing ceramic honeycomb structural bodies
NGK INSULATORS LTD44 citations92
US5316710AMay 31, 1994
Process for producing ceramic honeycomb structural bodies
NGK INSULATORS LTD60 citations91
US6803086B2Oct 12, 2004
Porous honeycomb structure body, the use thereof and method for manufacturing the same
NGK INSULATORS LTD41 citations89
US7052735B2May 30, 2006
Method of plugging at least some of the cells of a honeycomb structure
NGK INSULATORS LTD13 citations83
US7413625B2Aug 19, 2008
Bonding method of ceramic honeycomb structure
NGK INSULATORS LTD8 citations74
US5149264ASep 22, 1992
Method of producing ceramic products
NGK INSULATORS LTD14 citations73
US5265346ANov 30, 1993
Drying carrier adapted for carrying honeycomb structure
NGK INSULATORS LTD12 citations66
US7431873B2Oct 7, 2008
Method for manufacturing honeycomb structure
NGK INSULATORS LTD2 citations62
US7040327B2May 9, 2006
Die cleaning method
NGK INSULATORS LTD5 citations62
US7429351B2Sep 30, 2008
Method for manufacturing a porous ceramic structure
NGK INSULATORS LTD6 citations61
US7294304B2Nov 13, 2007
Die for forming honeycomb structure and method of manufacturing honeycomb structure
NGK INSULATORS LTD2 citations61
US5609807AMar 11, 1997
Production of ceramic structural bodies
NGK INSULATORS LTD5 citations57
US7544320B2Jun 9, 2009
Method of manufacturing porous ceramic body
NGK INSULATORS LTD1 citations51
SHIMADZU CORP
14 patentsUS10468365B2Nov 5, 2019
Semiconductor device and semiconductor detector, methods for manufacturing same, and semiconductor chip or substrate
SHIMADZU CORP4 citations73
US11179124B2Nov 23, 2021
X-ray phase imaging method
SHIMADZU CORP0 citations62
US10643760B2May 5, 2020
Method of producing diffraction grating
SHIMADZU CORP1 citations60
US7911610B2Mar 22, 2011
Optical measuring device
SHIMADZU CORP2 citations59
US7760356B2Jul 20, 2010
Optical measuring device and method, and nanoparticle measuring method and device
SHIMADZU CORP4 citations55
US11327029B2May 10, 2022
X-ray imaging device
SHIMADZU CORP0 citations52
US11311260B2Apr 26, 2022
X-ray phase imaging apparatus
SHIMADZU CORP0 citations52
US11272894B2Mar 15, 2022
X-ray imaging device
SHIMADZU CORP0 citations52
US11268916B2Mar 8, 2022
X-ray phase imaging system
SHIMADZU CORP0 citations52
US11166687B2Nov 9, 2021
X-ray imaging apparatus
SHIMADZU CORP0 citations52
US10729398B2Aug 4, 2020
Radiation phase contrast imaging device
SHIMADZU CORP0 citations51
US10859512B2Dec 8, 2020
X-ray phase contrast imaging apparatus
SHIMADZU CORP0 citations41
US10772592B2Sep 15, 2020
X-ray phase contrast imaging apparatus
SHIMADZU CORP0 citations41
US10254417B2Apr 9, 2019
Semiconductor detector
SHIMADZU CORP0 citations41
TOKYO OHKA KOGYO CO LTD
7 patentsUS12187943B2Jan 7, 2025
Chemical solution used for cleaning or etching ruthenium-containing layer and method for fabricating ruthenium wiring
TOKYO OHKA KOGYO CO LTD0 citations62
US11518937B2Dec 6, 2022
Etching solution and method for manufacturing semiconductor element
TOKYO OHKA KOGYO CO LTD0 citations61
US11898081B2Feb 13, 2024
Ruthenium-etching solution, method for manufacturing ruthenium-etching solution, method for processing object to be processed, and method for manufacturing ruthenium-containing wiring
TOKYO OHKA KOGYO CO LTD0 citations60
US11120994B2Sep 14, 2021
Etching solution, and method of producing semiconductor element
TOKYO OHKA KOGYO CO LTD0 citations60
US11686002B2Jun 27, 2023
Method for manufacturing ruthenium wiring
TOKYO OHKA KOGYO CO LTD0 citations58
US12104260B2Oct 1, 2024
Method for producing semiconductor element and chemical solution to be used in method for producing semiconductor element
TOKYO OHKA KOGYO CO LTD0 citations52
US12593639B2Mar 31, 2026
Method for processing substrate, chemical solution, and method for providing chemical solution
TOKYO OHKA KOGYO CO LTD0 citations51
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
3 patentsUS6664196B1Dec 16, 2003
Method of cleaning electronic device and method of fabricating the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD36 citations92
US6830979B2Dec 14, 2004
Method for fabricating semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD15 citations84
US6613636B2Sep 2, 2003
Method for fabricating semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD7 citations74