Inventor
URAOKA YUKIHARU
JP10 patents
⚠️ This page may combine multiple inventors who share the name “URAOKA YUKIHARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
6 patentsUS6005401ADec 21, 1999
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD140 citations98
US5945834AAug 31, 1999
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD160 citations98
US5650336AJul 22, 1997
Method of presuming life time of semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD59 citations95
US6323663B1Nov 27, 2001
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD37 citations92
US5598100AJan 28, 1997
Device for and method of evaluating semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD30 citations92
US5504431AApr 2, 1996
Device for and method of evaluating semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD24 citations92