Inventor
SPANNER ERWIN
DE18 patents
⚠️ This page may combine multiple inventors who share the name “SPANNER ERWIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HEIDENHAIN GMBH DR JOHANNES
17 patentsUS6369951B1Apr 9, 2002
Beam splitter assembly and interferometer having a beam splitter assembly
HEIDENHAIN GMBH DR JOHANNES30 citations92
US5977539ANov 2, 1999
Optical position-measuring device having reference mark graduation structures with chirp fields
HEIDENHAIN GMBH DR JOHANNES44 citations92
US5786931AJul 28, 1998
Phase grating and method of producing phase grating
HEIDENHAIN GMBH DR JOHANNES32 citations92
US5574560ANov 12, 1996
Dual-beam interferometer with a phase grating
HEIDENHAIN GMBH DR JOHANNES34 citations92
US5333048AJul 26, 1994
Polarizing interferometric displacement measuring arrangement
HEIDENHAIN GMBH DR JOHANNES39 citations92
US5079418AJan 7, 1992
Position measuring apparatus with reflection
HEIDENHAIN GMBH DR JOHANNES24 citations92
US6535290B1Mar 18, 2003
Optical position measuring device with a beam splitter
HEIDENHAIN GMBH DR JOHANNES25 citations91
US5711084AJan 27, 1998
Linear encoder
HEIDENHAIN GMBH DR JOHANNES29 citations91
US6907372B1Jun 14, 2005
Device for position indication and detection of guidance errors
HEIDENHAIN GMBH DR JOHANNES13 citations84
US7542149B2Jun 2, 2009
Optics system for an interferometer that uses a measuring mirror, a reference mirror and a beam deflector
HEIDENHAIN GMBH DR JOHANNES8 citations82
US5206704AApr 27, 1993
Position measuring apparatus and method of use thereof
HEIDENHAIN GMBH DR JOHANNES16 citations74
US5500734AMar 19, 1996
Photoelectric position measuring system with integral optical circuit having phase shifted interference gratings
HEIDENHAIN GMBH DR JOHANNES14 citations73
US6265992B1Jul 24, 2001
Position measuring system and method for operating a position measuring system
HEIDENHAIN GMBH DR JOHANNES12 citations71
US6097318AAug 1, 2000
Position measuring system and method for operating a position measuring system
HEIDENHAIN GMBH DR JOHANNES14 citations71
US7701593B2Apr 20, 2010
Optical position measuring arrangement
HEIDENHAIN GMBH DR JOHANNES4 citations63
US7639366B2Dec 29, 2009
Position-measuring device for determining the position of two objects movable with respect to each other along a measuring direction, and method for forming a reference pulse for such a position-measuring device
HEIDENHAIN GMBH DR JOHANNES3 citations62
US9188424B2Nov 17, 2015
Interferometer
HEIDENHAIN GMBH DR JOHANNES2 citations61