Inventor

FRANKOWSKY GERD

US46 patents

⚠️ This page may combine multiple inventors who share the name “FRANKOWSKY GERD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FRANKOWSKY GERD

INFINEON TECHNOLOGIES AG

Method for connection of circuit units

Method for producing an electronic component having a plurality of chips that are stacked one above the other and contact-connected to one another

Semiconductor circuit module and method for fabricating semiconductor circuit modules

Area efficient method for programming electrical fuses

On chip data comparator with variable data and compare result compression

Test system for testing integrated chips and an adapter element for a test system

Memory device and method of storing fail addresses of a memory cell

Level-shifting circuitry having “high” output impedance during disable mode

Fuse programmable I/O organization

Semiconductor package and method

Method to descramble the data mapping in memory circuits

Method and test device for determining a repair solution for a memory module

Integrated test circuit in an integrated circuit

Recording test information to identify memory cell errors

Semiconductor component

Semiconductor wafer testing system and method

On chip programmable data pattern generator for semiconductor memories

Twisted bit-line compensation

Calibration device for the calibration of a tester channel of a tester device and a test system

Integrated circuit, test system and method for reading out an error datum from the integrated circuit

Level-shifting circuitry having “high” output impedance during disable mode

Circuit technique for column redundancy fuse latches

Integrated semiconductor circuit having contact points and configuration having at least two such circuits

Method for assessing the quality of a memory unit

Method for checking a conductive connection between contact points

Method of attaching semiconductor devices on a switching device and such an attached device

Solder-free PCB assembly

Pulse width detection

Skew pointer generation

Pulse width detection

Semiconductor circuit device and a system for testing a semiconductor apparatus

Multiple chip semiconductor arrangement having electrical components in separating regions

Apparatus and method for monitoring a state, in particular of a fuse

Integrated module having a plurality of separate substrates

Semiconductor chip configuration with a layer sequence with functional elements contacted by contact pads

Dynamic logic circuit

Multiple chip semiconductor arrangement having electrical components in separating regions

Method and device for verifying output signals of an integrated circuit

Test system for testing integrated circuits and a method for configuring a test system

Process for producing a component module

Method for activating fuse units in electronic circuit device

INFINEON TECHNOLOGIES CORP

Dynamic memory refresh circuitry

Self trimming voltage generator

IBM

Dynamic DRAM refresh rate adjustment based on cell leakage monitoring

Twisted bit-line compensation for DRAM having redundancy

INFINEON TECHNOLOGIES

Programmable test socket