Inventor
HINTERMAIER FRANK
DE19 patents
⚠️ This page may combine multiple inventors who share the name “HINTERMAIER FRANK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
11 patentsUS6438019B2Aug 20, 2002
Ferroelectric random access memory (FeRAM) having storage capacitors with different coercive voltages
INFINEON TECHNOLOGIES AG29 citations92
US6586348B2Jul 1, 2003
Method for preventing etching-induced damage to a metal oxide film by patterning the film after a nucleation anneal but while still amorphous and then thermally annealing to crystallize
INFINEON TECHNOLOGIES AG18 citations84
US6156673ADec 5, 2000
Process for producing a ceramic layer
INFINEON TECHNOLOGIES AG17 citations83
US6168988B1Jan 2, 2001
Method for producing barrier-free semiconductor memory configurations
INFINEON TECHNOLOGIES AG7 citations74
US6790676B2Sep 14, 2004
Method for producing a ferroelectric layer
INFINEON TECHNOLOGIES AG7 citations69
US6730562B2May 4, 2004
Method of patterning ferroelectric layers
INFINEON TECHNOLOGIES AG4 citations63
US6316802B1Nov 13, 2001
Easy to manufacture integrated semiconductor memory configuration with platinum electrodes
INFINEON TECHNOLOGIES AG5 citations63
US6669857B2Dec 30, 2003
Process for etching bismuth-containing oxide films
INFINEON TECHNOLOGIES AG5 citations62
US6495415B2Dec 17, 2002
Method for fabricating a patterned layer
INFINEON TECHNOLOGIES AG3 citations62
US6527848B2Mar 4, 2003
Complex of an element of transition group IV or V for forming an improved precursor combination
INFINEON TECHNOLOGIES AG3 citations59
US7122856B1Oct 17, 2006
Capacitor having a barrier layer made of a transition metal phosphide, arsenide or sulfide
INFINEON TECHNOLOGIES AG1 citations51
SIEMENS AG
6 patentsUS6100187AAug 8, 2000
Method of producing a barrier layer in a semiconductor body
SIEMENS AG22 citations92
US6258153B1Jul 10, 2001
Device for the deposition of substances
SIEMENS AG8 citations73
US6037002AMar 14, 2000
Process for producing thin films of oxide ceramic
SIEMENS AG10 citations73
US6605505B2Aug 12, 2003
Process for producing an integrated semiconductor memory configuration
SIEMENS AG2 citations62
US6297526B1Oct 2, 2001
Process for producing barrier-free semiconductor memory configurations
SIEMENS AG3 citations62
US6126998AOct 3, 2000
Process for producing a ceramic layer containing Bi
SIEMENS AG4 citations62
ADVANCED TECH MATERIALS
2 patentsUS6120846ASep 19, 2000
Method for the selective deposition of bismuth based ferroelectric thin films by chemical vapor deposition
ADVANCED TECH MATERIALS65 citations94
US6010744AJan 4, 2000
Method for nucleation controlled chemical vapor deposition of metal oxide ferroelectric thin films
ADVANCED TECH MATERIALS55 citations94