Inventor
KNALL N JOHAN
US41 patents
⚠️ This page may combine multiple inventors who share the name “KNALL N JOHAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATRIX SEMICONDUCTOR INC
21 patentsUS6952043B2Oct 4, 2005
Electrically isolated pillars in active devices
MATRIX SEMICONDUCTOR INC218 citations99
US6888750B2May 3, 2005
Nonvolatile memory on SOI and compound semiconductor substrates and method of fabrication
MATRIX SEMICONDUCTOR INC497 citations99
US6822903B2Nov 23, 2004
Apparatus and method for disturb-free programming of passive element memory cells
MATRIX SEMICONDUCTOR INC118 citations99
US6653712B2Nov 25, 2003
Three-dimensional memory array and method of fabrication
MATRIX SEMICONDUCTOR INC197 citations99
US6631085B2Oct 7, 2003
Three-dimensional memory array incorporating serial chain diode stack
MATRIX SEMICONDUCTOR INC278 citations99
US6627530B2Sep 30, 2003
Patterning three dimensional structures
MATRIX SEMICONDUCTOR INC385 citations99
US6541312B2Apr 1, 2003
Formation of antifuse structure in a three dimensional memory
MATRIX SEMICONDUCTOR INC121 citations99
US6515888B2Feb 4, 2003
Low cost three-dimensional memory array
MATRIX SEMICONDUCTOR INC232 citations99
US6420215B1Jul 16, 2002
Three-dimensional memory array and method of fabrication
MATRIX SEMICONDUCTOR INC1,212 citations99
US7022572B2Apr 4, 2006
Manufacturing method for integrated circuit having disturb-free programming of passive element memory cells
MATRIX SEMICONDUCTOR INC71 citations98
US6954394B2Oct 11, 2005
Integrated circuit and method for selecting a set of memory-cell-layer-dependent or temperature-dependent operating conditions
MATRIX SEMICONDUCTOR INC71 citations98
US6777773B2Aug 17, 2004
Memory cell with antifuse layer formed at diode junction
MATRIX SEMICONDUCTOR INC109 citations98
US6704235B2Mar 9, 2004
Anti-fuse memory cell with asymmetric breakdown voltage
MATRIX SEMICONDUCTOR INC81 citations98
US6486065B2Nov 26, 2002
Method of forming nonvolatile memory device utilizing a hard mask
MATRIX SEMICONDUCTOR INC107 citations98
US6490218B1Dec 3, 2002
Digital memory method and system for storing multiple bit digital data
MATRIX SEMICONDUCTOR INC71 citations96
US6963504B2Nov 8, 2005
Apparatus and method for disturb-free programming of passive element memory cells
MATRIX SEMICONDUCTOR INC18 citations93
US6767816B2Jul 27, 2004
Method for making a three-dimensional memory array incorporating serial chain diode stack
MATRIX SEMICONDUCTOR INC27 citations93
US6642603B1Nov 4, 2003
Same conductivity type highly-doped regions for antifuse memory cell
MATRIX SEMICONDUCTOR INC43 citations93
US6770939B2Aug 3, 2004
Thermal processing for three dimensional circuits
MATRIX SEMICONDUCTOR INC13 citations84
US6768185B2Jul 27, 2004
Formation of antifuse structure in a three dimensional memory
MATRIX SEMICONDUCTOR INC8 citations74
US6624011B1Sep 23, 2003
Thermal processing for three dimensional circuits
MATRIX SEMICONDUCTOR INC11 citations74
CANDESCENT TECH CORP
13 patentsUS6004180ADec 21, 1999
Cleaning of electron-emissive elements
CANDESCENT TECH CORP58 citations95
US6019658AFeb 1, 2000
Fabrication of gated electron-emitting device utilizing distributed particles to define gate openings, typically in combination with spacer material to control spacing between gate layer and electron-emissive elements
CANDESCENT TECH CORP17 citations93
US6007695ADec 28, 1999
Selective removal of material using self-initiated galvanic activity in electrolytic bath
CANDESCENT TECH CORP41 citations93
US5920151AJul 6, 1999
Structure and fabrication of electron-emitting device having focus coating contacted through underlying access conductor
CANDESCENT TECH CORP26 citations92
US6187603B1Feb 13, 2001
Fabrication of gated electron-emitting devices utilizing distributed particles to define gate openings, typically in combination with lift-off of excess emitter material
CANDESCENT TECH CORP15 citations84
US6008062ADec 28, 1999
Undercutting technique for creating coating in spaced-apart segments
CANDESCENT TECH CORP17 citations84
US6013986AJan 11, 2000
Electron-emitting device having multi-layer resistor
CANDESCENT TECH CORP17 citations83
US5863233AJan 26, 1999
Field emitter fabrication using open circuit electrochemical lift off
CANDESCENT TECH CORP17 citations83
US6013974AJan 11, 2000
Electron-emitting device having focus coating that extends partway into focus openings
CANDESCENT TECH CORP11 citations74
US5865659AFeb 2, 1999
Fabrication of gated electron-emitting device utilizing distributed particles to define gate openings and utilizing spacer material to control spacing between gate layer and electron-emissive elements
CANDESCENT TECH CORP14 citations74
US5893967AApr 13, 1999
Impedance-assisted electrochemical removal of material, particularly excess emitter material in electron-emitting device
CANDESCENT TECH CORP8 citations72
US6010383AJan 4, 2000
Protection of electron-emissive elements prior to removing excess emitter material during fabrication of electron-emitting device
CANDESCENT TECH CORP6 citations63
US6027632AFeb 22, 2000
Multi-step removal of excess emitter material in fabricating electron-emitting device
CANDESCENT TECH CORP3 citations59
SANDISK 3D LLC
5 patentsUS7304888B2Dec 4, 2007
Reverse-bias method for writing memory cells in a memory array
SANDISK 3D LLC37 citations93
US7071565B2Jul 4, 2006
Patterning three dimensional structures
SANDISK 3D LLC17 citations92
US7413945B2Aug 19, 2008
Electrically isolated pillars in active devices
SANDISK 3D LLC8 citations74
US7816188B2Oct 19, 2010
Process for fabricating a dielectric film using plasma oxidation
SANDISK 3D LLC5 citations63
US7091529B2Aug 15, 2006
Three-dimensional memory array and method of fabrication
SANDISK 3D LLC4 citations63