Inventor
HOSSAIN TIM Z
US29 patents
⚠️ This page may combine multiple inventors who share the name “HOSSAIN TIM Z”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
25 patentsUS5778039AJul 7, 1998
Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)
ADVANCED MICRO DEVICES INC141 citations97
US5742658AApr 21, 1998
Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer
ADVANCED MICRO DEVICES INC143 citations97
US6067154AMay 23, 2000
Method and apparatus for the molecular identification of defects in semiconductor manufacturing using a radiation scattering technique such as raman spectroscopy
ADVANCED MICRO DEVICES INC75 citations96
US6075261AJun 13, 2000
Neutron detecting semiconductor device
ADVANCED MICRO DEVICES INC58 citations94
US6151119ANov 21, 2000
Apparatus and method for determining depth profile characteristics of a dopant material in a semiconductor device
ADVANCED MICRO DEVICES INC67 citations93
US6515367B1Feb 4, 2003
Sub-cap and method of manufacture therefor in integrated circuit capping layers
ADVANCED MICRO DEVICES INC21 citations92
US6406996B1Jun 18, 2002
Sub-cap and method of manufacture therefor in integrated circuit capping layers
ADVANCED MICRO DEVICES INC16 citations92
US6043486AMar 28, 2000
Absolute standard reference materials for low-level concentration measurements
ADVANCED MICRO DEVICES INC21 citations92
US5657363AAug 12, 1997
Method and apparatus for determining the thickness and elemental composition of a thin film using radioisotopic X-ray fluorescence (RXRF)
ADVANCED MICRO DEVICES INC43 citations92
US6434217B1Aug 13, 2002
System and method for analyzing layers using x-ray transmission
ADVANCED MICRO DEVICES INC19 citations91
US6144103ANov 7, 2000
Graded PB for C4 bump technology
ADVANCED MICRO DEVICES INC19 citations91
US6097079AAug 1, 2000
Boron implanted dielectric structure
ADVANCED MICRO DEVICES INC17 citations91
US5965945AOct 12, 1999
Graded PB for C4 pump technology
ADVANCED MICRO DEVICES INC31 citations91
US5913131AJun 15, 1999
Alternative process for BPTEOS/BPSG layer formation
ADVANCED MICRO DEVICES INC32 citations91
US5754620AMay 19, 1998
Apparatus and method for characterizing particles embedded within a thin film configured upon a semiconductor wafer
ADVANCED MICRO DEVICES INC51 citations91
US6005915ADec 21, 1999
Apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photons
ADVANCED MICRO DEVICES INC42 citations89
US6173036B1Jan 9, 2001
Depth profile metrology using grazing incidence X-ray fluorescence
ADVANCED MICRO DEVICES INC54 citations88
US6376267B1Apr 23, 2002
Scattered incident X-ray photons for measuring surface roughness of a semiconductor topography
ADVANCED MICRO DEVICES INC26 citations86
US5866899AFeb 2, 1999
Concentration measurement apparatus calibration method
ADVANCED MICRO DEVICES INC16 citations82
US6579788B1Jun 17, 2003
Method of forming conductive interconnections on an integrated circuit device
ADVANCED MICRO DEVICES INC16 citations80
US6271112B1Aug 7, 2001
Interlayer between titanium nitride and high density plasma oxide
ADVANCED MICRO DEVICES INC12 citations72
US6242785B1Jun 5, 2001
Nitride based sidewall spaces for submicron MOSFETs
ADVANCED MICRO DEVICES INC12 citations72
US6191032B1Feb 20, 2001
Thin titanium film as self-regulating filter for silicon migration into aluminum metal lines
ADVANCED MICRO DEVICES INC12 citations70
US5841016ANov 24, 1998
Ultra-low level standard for concentration measurements
ADVANCED MICRO DEVICES INC14 citations69
US6156650ADec 5, 2000
Method of releasing gas trapped during deposition
ADVANCED MICRO DEVICES INC2 citations55