Inventor
WESTON NICHOLAS JOHN
GB22 patents
⚠️ This page may combine multiple inventors who share the name “WESTON NICHOLAS JOHN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RENISHAW PLC
13 patentsUS10399145B2Sep 3, 2019
Additive manufacturing apparatus and method
RENISHAW PLC17 citations94
US7861430B2Jan 4, 2011
Articulating probe head apparatus and method
RENISHAW PLC20 citations92
US7456538B2Nov 25, 2008
Reaction balanced rotary drive mechanism
RENISHAW PLC22 citations92
US8006398B2Aug 30, 2011
Method for scanning the surface of a workpiece
RENISHAW PLC42 citations91
US8001859B2Aug 23, 2011
Method of error compensation in a coordinate measuring machine
RENISHAW PLC18 citations91
US7568373B2Aug 4, 2009
Method of error compensation in a coordinate measuring machine
RENISHAW PLC23 citations91
US7908759B2Mar 22, 2011
Method for scanning the surface of a workpiece
RENISHAW PLC10 citations81
US11105607B2Aug 31, 2021
Non-contact probe and method of operation
RENISHAW PLC2 citations71
US7856731B2Dec 28, 2010
Contact sensing probe
RENISHAW PLC3 citations63
US11123799B2Sep 21, 2021
Additive manufacturing apparatus and method
RENISHAW PLC1 citations62
USRE46012EMay 24, 2016
Non-contact probe
RENISHAW PLC1 citations61
US7891109B2Feb 22, 2011
Contact sensing probe
RENISHAW PLC6 citations54
US9945697B2Apr 17, 2018
Measurement scale with periodic nanostructure
RENISHAW PLC0 citations46
WESTON NICHOLAS JOHN
6 patentsUS8923603B2Dec 30, 2014
Non-contact measurement apparatus and method
WESTON NICHOLAS JOHN22 citations88
US8605983B2Dec 10, 2013
Non-contact probe
WESTON NICHOLAS JOHN12 citations82
US9618329B2Apr 11, 2017
Optical inspection probe
WESTON NICHOLAS JOHN3 citations65
US9329030B2May 3, 2016
Non-contact object inspection
WESTON NICHOLAS JOHN2 citations60
US8792707B2Jul 29, 2014
Phase analysis measurement apparatus and method
WESTON NICHOLAS JOHN2 citations57
US10226840B2Mar 12, 2019
Method of forming an optical device
WESTON NICHOLAS JOHN0 citations42