Inventor
KAWOOSA MUDASIR SHAFAT
IN15 patents
Patents
15 patentsUS10060979B2Aug 28, 2018
Generating multiple pseudo static control signals using on-chip JTAG state machine
TEXAS INSTRUMENTS INC6 citations82
US10746797B1Aug 18, 2020
Dynamically protective scan data control
TEXAS INSTRUMENTS INC6 citations72
US11408936B2Aug 9, 2022
Generating multiple pseudo static control signals using on-chip JTAG state machine
TEXAS INSTRUMENTS INC2 citations71
US10739402B2Aug 11, 2020
Generating multiple pseudo static control signals using on-chip JTAG state machine
TEXAS INSTRUMENTS INC2 citations71
US10088525B2Oct 2, 2018
Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs
TEXAS INSTRUMENTS INC4 citations71
US9772376B1Sep 26, 2017
Increase data transfer throughput by enabling dynamic JTAG test mode entry and sharing of all JTAG pins
TEXAS INSTRUMENTS INC6 citations71
US11402432B2Aug 2, 2022
Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface
TEXAS INSTRUMENTS INC2 citations68
US10852353B1Dec 1, 2020
Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface
TEXAS INSTRUMENTS INC4 citations68
US11899063B2Feb 13, 2024
Generating multiple pseudo static control signals using on-chip JTAG state machine
TEXAS INSTRUMENTS INC0 citations61
US9261560B2Feb 16, 2016
Handling slower scan outputs at optimal frequency
TEXAS INSTRUMENTS INC2 citations61
US11747399B2Sep 5, 2023
Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface
TEXAS INSTRUMENTS INC0 citations58
US10877093B2Dec 29, 2020
Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs
TEXAS INSTRUMENTS INC0 citations50
US9970987B2May 15, 2018
Method and apparatus for test time reduction using fractional data packing
TEXAS INSTRUMENTS INC0 citations50
US9448284B2Sep 20, 2016
Method and apparatus for test time reduction using fractional data packing
TEXAS INSTRUMENTS INC0 citations50
US9347991B1May 24, 2016
Scan throughput enhancement in scan testing of a device-under-test
TEXAS INSTRUMENTS INC0 citations40