Inventor
MITTAL RAJESH KUMAR
IN10 patents
⚠️ This page may combine multiple inventors who share the name “MITTAL RAJESH KUMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
9 patentsUS10983161B2Apr 20, 2021
Full pad coverage boundary scan
TEXAS INSTRUMENTS INC1 citations71
US10088525B2Oct 2, 2018
Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs
TEXAS INSTRUMENTS INC4 citations71
US9535123B2Jan 3, 2017
Frequency scaled segmented scan chain for integrated circuits
TEXAS INSTRUMENTS INC4 citations71
US9581645B2Feb 28, 2017
Test circuit providing different levels of concurrency among radio cores
TEXAS INSTRUMENTS INC2 citations66
US9261560B2Feb 16, 2016
Handling slower scan outputs at optimal frequency
TEXAS INSTRUMENTS INC2 citations61
US11821945B2Nov 21, 2023
Full pad coverage boundary scan
TEXAS INSTRUMENTS INC0 citations60
US9239360B2Jan 19, 2016
DFT approach to enable faster scan chain diagnosis
TEXAS INSTRUMENTS INC2 citations53
US10877093B2Dec 29, 2020
Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs
TEXAS INSTRUMENTS INC0 citations50
US9347991B1May 24, 2016
Scan throughput enhancement in scan testing of a device-under-test
TEXAS INSTRUMENTS INC0 citations40