Inventor
NA TAEHUI
KR21 patents
⚠️ This page may combine multiple inventors who share the name “NA TAEHUI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
QUALCOMM INC
12 patentsUS9378781B1Jun 28, 2016
System, apparatus, and method for sense amplifiers
QUALCOMM INC25 citations94
US9390779B2Jul 12, 2016
System and method of sensing a memory cell
QUALCOMM INC8 citations84
US9281039B2Mar 8, 2016
System and method to provide a reference cell using magnetic tunnel junction cells
QUALCOMM INC7 citations84
US9800271B2Oct 24, 2017
Error correction and decoding
QUALCOMM INC8 citations83
US9666259B1May 30, 2017
Dual mode sensing scheme
QUALCOMM INC11 citations83
US9502088B2Nov 22, 2016
Constant sensing current for reading resistive memory
QUALCOMM INC6 citations73
US9406354B1Aug 2, 2016
System, apparatus, and method for an offset cancelling single ended sensing circuit
QUALCOMM INC6 citations73
US9165630B2Oct 20, 2015
Offset canceling dual stage sensing circuit
QUALCOMM INC4 citations73
US9111623B1Aug 18, 2015
NMOS-offset canceling current-latched sense amplifier
QUALCOMM INC6 citations73
US10263645B2Apr 16, 2019
Error correction and decoding
QUALCOMM INC4 citations72
US9691462B2Jun 27, 2017
Latch offset cancelation for magnetoresistive random access memory
QUALCOMM INC5 citations72
US9502091B1Nov 22, 2016
Sensing circuit for resistive memory cells
QUALCOMM INC3 citations72
SAMSUNG ELECTRONICS CO LTD
6 patentsUS11127457B2Sep 21, 2021
Memory device with reduced read disturbance and method of operating the memory device
SAMSUNG ELECTRONICS CO LTD2 citations71
US11100959B2Aug 24, 2021
Variable resistance memory device
SAMSUNG ELECTRONICS CO LTD2 citations71
US11100990B2Aug 24, 2021
Memory device for avoiding multi-turn on of memory cell during reading, and operating method thereof
SAMSUNG ELECTRONICS CO LTD0 citations61
US11475948B2Oct 18, 2022
Memory device and operating method of memory device
SAMSUNG ELECTRONICS CO LTD0 citations51
US11011228B2May 18, 2021
Memory device having an increased sensing margin
SAMSUNG ELECTRONICS CO LTD0 citations51
US10998038B2May 4, 2021
Memory device and method of operating the same
SAMSUNG ELECTRONICS CO LTD0 citations50
QUALCOMM TECHNOLOGIES INC
2 patentsUS9852783B1Dec 26, 2017
Metal-oxide semiconductor (MOS) transistor offset-cancelling (OC), zero-sensing (ZS) dead zone, current-latched sense amplifiers (SAs) (CLSAs) (OCZS-SAs) for sensing differential voltages
QUALCOMM TECHNOLOGIES INC31 citations93
US9728259B1Aug 8, 2017
Non-volatile (NV)-content addressable memory (CAM) (NV-CAM) cells employing differential magnetic tunnel junction (MTJ) sensing for increased sense margin
QUALCOMM TECHNOLOGIES INC21 citations93