Inventor
CALDWELL BRIAN N
US5 patents
⚠️ This page may combine multiple inventors who share the name “CALDWELL BRIAN N”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
3 patentsUS9996000B2Jun 12, 2018
Test pattern layout for test photomask and method for evaluating critical dimension changes
IBM0 citations47
US9989843B2Jun 5, 2018
Test pattern layout for test photomask and method for evaluating critical dimension changes
IBM0 citations47
US9372394B2Jun 21, 2016
Test pattern layout for test photomask and method for evaluating critical dimension changes
IBM0 citations47