P

Inventor

LIN SHI-TRON

TW73 patents
⚠️ This page may combine multiple inventors who share the name “LIN SHI-TRON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WINBOND ELECTRONICS CORP

49 patents
US6388292B1May 14, 2002

Distributed MOSFET structure with enclosed gate for improved transistor size/layout area ratio and uniform ESD triggering

WINBOND ELECTRONICS CORP129 citations99
US6919602B2Jul 19, 2005

Gate-coupled MOSFET ESD protection circuit

WINBOND ELECTRONICS CORP81 citations98
US6306749B1Oct 23, 2001

Bond pad with pad edge strengthening structure

WINBOND ELECTRONICS CORP79 citations96
US6002156ADec 14, 1999

Distributed MOSFET structure with enclosed gate for improved transistor size/layout area ratio and uniform ESD triggering

WINBOND ELECTRONICS CORP83 citations96
US5959488ASep 28, 1999

Dual-node capacitor coupled MOSFET for improving ESD performance

WINBOND ELECTRONICS CORP86 citations96
US5870268AFeb 9, 1999

Early trigger of ESD protection device by a current spike generator

WINBOND ELECTRONICS CORP54 citations96
US6181016B1Jan 30, 2001

Bond-pad with a single anchoring structure

WINBOND ELECTRONICS CORP63 citations95
US6849902B1Feb 1, 2005

Input/output cell with robust electrostatic discharge protection

WINBOND ELECTRONICS CORP22 citations93
US6611025B2Aug 26, 2003

Apparatus and method for improved power bus ESD protection

WINBOND ELECTRONICS CORP23 citations93
US6501136B1Dec 31, 2002

High-speed MOSFET structure for ESD protection

WINBOND ELECTRONICS CORP31 citations93
US6476449B1Nov 5, 2002

Silicide block for ESD protection devices

WINBOND ELECTRONICS CORP46 citations93
US6473282B1Oct 29, 2002

Latch-up protection circuit for integrated circuits biased with multiple power supplies and its method

WINBOND ELECTRONICS CORP21 citations93
US6304127B1Oct 16, 2001

Negative-voltage-trigger SCR with a stack-gate ESD transient switch

WINBOND ELECTRONICS CORP25 citations93
US6246094B1Jun 12, 2001

Buried shallow trench isolation and method for forming the same

WINBOND ELECTRONICS CORP34 citations93
US6233130B1May 15, 2001

ESD Protection device integrated with SCR

WINBOND ELECTRONICS CORP38 citations93
US6157070ADec 5, 2000

Protection circuit against latch-up in a multiple-supply integrated circuit

WINBOND ELECTRONICS CORP23 citations93
US6107681AAug 22, 2000

Pin-assignment method for integrated circuit packages to increase the electro-static discharge protective capability thereof

WINBOND ELECTRONICS CORP17 citations93
US6091593AJul 18, 2000

Early trigger of ESD protection device by a negative voltage pump circuit

WINBOND ELECTRONICS CORP39 citations93
US6083797AJul 4, 2000

Buried shallow trench isolation and method for forming the same

WINBOND ELECTRONICS CORP22 citations93
US5982601ANov 9, 1999

Direct transient-triggered SCR for ESD protection

WINBOND ELECTRONICS CORP29 citations93
US5955763ASep 21, 1999

Low noise, high current-drive MOSFET structure for uniform serpentine-shaped poly-gate turn-on during an ESD event

WINBOND ELECTRONICS CORP53 citations93
US5869870AFeb 9, 1999

Electrostatic discharge (ESD) protective device for integrated circuit packages with no-connect pins

WINBOND ELECTRONICS CORP36 citations93
US5763919AJun 9, 1998

MOS transistor structure for electro-static discharge protection circuitry having dispersed parallel paths

WINBOND ELECTRONICS CORP29 citations93
US5742083AApr 21, 1998

Electrostatic discharge protection metal-oxide semiconductor field-effect transistor with segmented diffusion regions

WINBOND ELECTRONICS CORP27 citations93
US5721439AFeb 24, 1998

MOS transistor structure for electro-static discharge protection circuitry

WINBOND ELECTRONICS CORP39 citations93
US6551916B2Apr 22, 2003

Bond-pad with pad edge strengthening structure

WINBOND ELECTRONICS CORP31 citations92
US6344814B1Feb 5, 2002

Driving circuit

WINBOND ELECTRONICS CORP34 citations92
US6313541B1Nov 6, 2001

Bone-pad with pad edge strengthening structure

WINBOND ELECTRONICS CORP44 citations92
US7009252B2Mar 7, 2006

ESD protection devices and methods for reducing trigger voltage

WINBOND ELECTRONICS CORP42 citations91
US6958896B2Oct 25, 2005

Early triggered ESD MOSFET protection circuit and method thereof

WINBOND ELECTRONICS CORP22 citations91
US6573568B2Jun 3, 2003

ESD protection devices and methods for reducing trigger voltage

WINBOND ELECTRONICS CORP18 citations91
US6178549B1Jan 23, 2001

Memory writer with deflective memory-cell handling capability

WINBOND ELECTRONICS CORP23 citations91
US5852541ADec 22, 1998

Early trigger of ESD protection device by an oscillation circuit

WINBOND ELECTRONICS CORP36 citations91
US5818086AOct 6, 1998

Reinforced ESD protection for NC-pin adjacent input pin

WINBOND ELECTRONICS CORP29 citations91
US6864536B2Mar 8, 2005

Electrostatic discharge protection circuit

WINBOND ELECTRONICS CORP49 citations89
US6141768AOct 31, 2000

Self-corrective memory system and method

WINBOND ELECTRONICS CORP24 citations89
US6108797AAug 22, 2000

Method and system for loading microprograms in partially defective memory

WINBOND ELECTRONICS CORP32 citations89
US7012307B2Mar 14, 2006

Output buffer with good ESD protection

WINBOND ELECTRONICS CORP15 citations84
US6858900B2Feb 22, 2005

ESD protection devices and methods to reduce trigger voltage

WINBOND ELECTRONICS CORP14 citations84
US6829722B2Dec 7, 2004

System and method of processing memory

WINBOND ELECTRONICS CORP15 citations84
US6552594B2Apr 22, 2003

Output buffer with improved ESD protection

WINBOND ELECTRONICS CORP14 citations84
US6542346B1Apr 1, 2003

High-voltage tolerance input buffer and ESD protection circuit

WINBOND ELECTRONICS CORP19 citations84
US6043967AMar 28, 2000

Early trigger of ESD protection device by a voltage pump circuit

WINBOND ELECTRONICS CORP16 citations84
US5892261AApr 6, 1999

SRAM bitline pull-up MOSFET structure for internal circuit electro-static discharge immunity

WINBOND ELECTRONICS CORP17 citations83
US6510088B2Jan 21, 2003

Semiconductor device having reduced leakage and method of operating the same

WINBOND ELECTRONICS CORP17 citations82
US6838708B2Jan 4, 2005

I/O cell and ESD protection circuit

WINBOND ELECTRONICS CORP8 citations74
US6730967B2May 4, 2004

Electrostatic discharge protection devices and methods for the formation thereof

WINBOND ELECTRONICS CORP10 citations74
US6664599B1Dec 16, 2003

ESD protection device

WINBOND ELECTRONICS CORP11 citations74
US6628160B2Sep 30, 2003

Semiconductor integrated circuit for low-voltage high-speed operation

WINBOND ELECTRONICS CORP11 citations74

WINDBOND ELECTRONICS CORP

1 patent

Showing the top 50 of 73 patents by PatentIndex Score.