Inventor
HIRONO MASATOSHI
JP23 patents
⚠️ This page may combine multiple inventors who share the name “HIRONO MASATOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
15 patentsUS7648256B2Jan 19, 2010
Lighting system having lenses for light sources emitting rays at different wavelengths
TOSHIBA KK47 citations94
US5946282AAug 31, 1999
Optical recording/reproducing apparatus
TOSHIBA KK35 citations92
US7403142B2Jul 22, 2008
Optical quantizing unit and optical A/D converter
TOSHIBA KK9 citations84
US11387992B2Jul 12, 2022
Transmitting device, receiving device, and quantum key distribution system
TOSHIBA KK7 citations81
US7671771B2Mar 2, 2010
Optical quantizing unit and optical A/D converter
TOSHIBA KK7 citations74
US7403143B2Jul 22, 2008
Optical quantizing unit and optical A/D converter
TOSHIBA KK7 citations74
US10816663B2Oct 27, 2020
Distance measuring device and distance measuring method
TOSHIBA KK2 citations72
US8004655B2Aug 23, 2011
Automatic focus adjusting mechanism and optical image acquisition apparatus
TOSHIBA KK2 citations63
US12270759B2Apr 8, 2025
Gas detection device
TOSHIBA KK0 citations62
US10630392B2Apr 21, 2020
Quantum communication system, transmitting apparatus, and receiving apparatus
TOSHIBA KK1 citations58
US9436001B2Sep 6, 2016
Light beam scanner
TOSHIBA KK1 citations51
US9746140B2Aug 29, 2017
LED lighting device
TOSHIBA KK0 citations41
US9372389B2Jun 21, 2016
Projector and portable terminal
TOSHIBA KK0 citations41
US7935460B2May 3, 2011
Mask blank for EUV exposure and mask for EUV exposure
TOSHIBA KK0 citations41
US7863588B2Jan 4, 2011
Lighting optical apparatus and sample inspection apparatus
TOSHIBA KK0 citations41
NUFLARE TECHNOLOGY INC
6 patentsUS10197507B2Feb 5, 2019
Inspection apparatus
NUFLARE TECHNOLOGY INC3 citations73
US9846928B2Dec 19, 2017
Inspection method and inspection apparatus
NUFLARE TECHNOLOGY INC2 citations73
US10410335B2Sep 10, 2019
Inspection method and inspection apparatus
NUFLARE TECHNOLOGY INC0 citations52
US10007980B2Jun 26, 2018
Inspection method and inspection apparatus
NUFLARE TECHNOLOGY INC0 citations52
US9683947B2Jun 20, 2017
Defect inspection device
NUFLARE TECHNOLOGY INC1 citations52
US9157870B2Oct 13, 2015
Pattern test apparatus
NUFLARE TECHNOLOGY INC0 citations41