Inventor
YU-TSENG HSIEN
TW13 patents
Patents
13 patentsUS11288437B2Mar 29, 2022
Electromigration evaluation methodology with consideration of both self-heating and heat sink thermal effects
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations83
US10867109B2Dec 15, 2020
Electromigration evaluation methodology with consideration of both self-heating and heat sink thermal effects
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations83
US10460070B2Oct 29, 2019
Optimized electromigration analysis
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12530516B2Jan 20, 2026
Method and non-transitory computer-readable medium for arranging components within a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12265773B2Apr 1, 2025
Method and apparatus for electromigration evaluation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11861285B2Jan 2, 2024
Electromigration evaluation methodology with consideration of current distribution
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11675950B2Jun 13, 2023
Method and apparatus for electromigration evaluation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11055470B2Jul 6, 2021
Optimized electromigration analysis
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9342646B2May 17, 2016
Method, system and computer readable medium using stitching for mask assignment of patterns
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12242790B2Mar 4, 2025
Method and apparatus of electromigration check
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11256847B2Feb 22, 2022
Method and apparatus of electromigration check
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12314652B2May 27, 2025
Methods and non-transitory computer-readable media for inter-metal dielectric reliability check
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9824968B2Nov 21, 2017
Method, system and computer readable medium using stitching for mask assignment of patterns
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51