Inventor
FANG SHENQING
US97 patents
⚠️ This page may combine multiple inventors who share the name “FANG SHENQING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SPANSION LLC
21 patentsUS6987696B1Jan 17, 2006
Method of improving erase voltage distribution for a flash memory array having dummy wordlines
SPANSION LLC38 citations93
US6808992B1Oct 26, 2004
Method and system for tailoring core and periphery cells in a nonvolatile memory
SPANSION LLC24 citations92
US9368606B2Jun 14, 2016
Memory first process flow and device
SPANSION LLC9 citations84
US8822289B2Sep 2, 2014
High voltage gate formation
SPANSION LLC9 citations84
US8349685B2Jan 8, 2013
Dual spacer formation in flash memory
SPANSION LLC8 citations84
US7951704B2May 31, 2011
Memory device peripheral interconnects and method of manufacturing
SPANSION LLC8 citations84
US8035153B2Oct 11, 2011
Self-aligned patterning method by using non-conformal film and etch for flash memory and other semiconductor applications
SPANSION LLC9 citations83
US9209197B2Dec 8, 2015
Memory gate landing pad made from dummy features
SPANSION LLC5 citations73
US8836006B2Sep 16, 2014
Integrated circuits with non-volatile memory and methods for manufacture
SPANSION LLC4 citations73
US7170130B2Jan 30, 2007
Memory cell with reduced DIBL and Vss resistance
SPANSION LLC8 citations73
US7151028B1Dec 19, 2006
Memory cell with plasma-grown oxide spacer for reduced DIBL and Vss resistance and increased reliability
SPANSION LLC8 citations73
US8874253B2Oct 28, 2014
Self-aligned NAND flash select-gate wordlines for spacer double patterning
SPANSION LLC5 citations72
US7907448B2Mar 15, 2011
Scaled down select gates of NAND flash memory cell strings and method of forming same
SPANSION LLC2 citations63
US7301193B2Nov 27, 2007
Structure and method for low Vss resistance and reduced DIBL in a floating gate memory cell
SPANSION LLC2 citations63
US7851306B2Dec 14, 2010
Method for forming a flash memory device with straight word lines
SPANSION LLC4 citations62
US7829936B2Nov 9, 2010
Split charge storage node inner spacer process
SPANSION LLC2 citations62
US7732276B2Jun 8, 2010
Self-aligned patterning method by using non-conformal film and etch back for flash memory and other semiconductor applications
SPANSION LLC4 citations62
US7488657B2Feb 10, 2009
Method and system for forming straight word lines in a flash memory array
SPANSION LLC3 citations62
US6974995B1Dec 13, 2005
Method and system for forming dual gate structures in a nonvolatile memory using a protective layer
SPANSION LLC3 citations62
US9466496B2Oct 11, 2016
Spacer formation with straight sidewall
SPANSION LLC2 citations61
US7675104B2Mar 9, 2010
Integrated circuit memory system employing silicon rich layers
SPANSION LLC3 citations61
CYPRESS SEMICONDUCTOR CORP
15 patentsUS10361215B2Jul 23, 2019
NAND memory cell string having a stacked select gate structure and process for for forming same
CYPRESS SEMICONDUCTOR CORP4 citations84
US10038004B2Jul 31, 2018
NAND memory cell string having a stacked select gate structure and process for for forming same
CYPRESS SEMICONDUCTOR CORP5 citations84
US10014380B2Jul 3, 2018
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP4 citations84
US10566341B2Feb 18, 2020
NAND memory cell string having a stacked select gate structure and process for for forming same
CYPRESS SEMICONDUCTOR CORP3 citations73
US9997253B1Jun 12, 2018
Non-volatile memory array with memory gate line and source line scrambling
CYPRESS SEMICONDUCTOR CORP3 citations73
US9917166B2Mar 13, 2018
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP3 citations73
US9614105B2Apr 4, 2017
Charge-trap NOR with silicon-rich nitride as a charge trap layer
CYPRESS SEMICONDUCTOR CORP2 citations73
US9589805B2Mar 7, 2017
Split-gate semiconductor device with L-shaped gate
CYPRESS SEMICONDUCTOR CORP2 citations73
US11450680B2Sep 20, 2022
Split gate charge trapping memory cells having different select gate and memory gate heights
CYPRESS SEMICONDUCTOR CORP0 citations63
US11257675B2Feb 22, 2022
Tilted implant for poly resistors
CYPRESS SEMICONDUCTOR CORP1 citations63
US10923601B2Feb 16, 2021
Charge trapping split gate device and method of fabricating same
CYPRESS SEMICONDUCTOR CORP0 citations63
US11342429B2May 24, 2022
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP0 citations62
US11069699B2Jul 20, 2021
NAND memory cell string having a stacked select gate structure and process for forming same
CYPRESS SEMICONDUCTOR CORP0 citations62
US12237387B2Feb 25, 2025
Method of spacer formation with straight sidewall of memory cells
CYPRESS SEMICONDUCTOR CORP0 citations61
US10818761B2Oct 27, 2020
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP0 citations52
FANG SHENQING
5 patentsUS8669597B2Mar 11, 2014
Memory device interconnects and method of manufacturing
FANG SHENQING6 citations84
US8441041B2May 14, 2013
Memory device peripheral interconnects
FANG SHENQING2 citations62
US8441063B2May 14, 2013
Memory with extended charge trapping layer
FANG SHENQING4 citations62
US8143661B2Mar 27, 2012
Memory cell system with charge trap
FANG SHENQING5 citations61
US8551858B2Oct 8, 2013
Self-aligned SI rich nitride charge trap layer isolation for charge trap flash memory
FANG SHENQING2 citations60
MONTEREY RES LLC
3 patentsUS11069789B2Jul 20, 2021
Varied silicon richness silicon nitride formation
MONTEREY RES LLC0 citations61
US10833009B2Nov 10, 2020
Memory device interconnects and method of manufacture
MONTEREY RES LLC0 citations52
US10833013B2Nov 10, 2020
Memory device interconnects and method of manufacture
MONTEREY RES LLC0 citations52
ADVANCED MICRO DEVICES INC
2 patentsCHEN TUNG-SHENG
2 patentsADVANCED MIRCO DEVICES INC
1 patentKANG INKUK
1 patentShowing the top 50 of 97 patents by PatentIndex Score.