Inventor
LIN JIAN-HONG
TW52 patents
⚠️ This page may combine multiple inventors who share the name “LIN JIAN-HONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
27 patentsUS11094702B1Aug 17, 2021
One-time programmable memory device including anti-fuse element and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US11978511B2May 7, 2024
Phase-change memory cell and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11616002B2Mar 28, 2023
Through-circuit vias in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10777510B2Sep 15, 2020
Semiconductor device including dummy via anchored to dummy metal layer
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations70
US11972826B2Apr 30, 2024
System and method for extending lifetime of memory device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US12349268B2Jul 1, 2025
Package component
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12154838B2Nov 26, 2024
Semiconductor arrangement and method of forming
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11924965B2Mar 5, 2024
Package component and forming method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12293959B2May 6, 2025
Through-circuit Vias in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12243805B2Mar 4, 2025
Through-circuit vias in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12131992B2Oct 29, 2024
Semiconductor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11963347B2Apr 16, 2024
One-time programmable memory device including anti-fuse element
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11830806B2Nov 28, 2023
Semiconductor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11665890B2May 30, 2023
One-time programmable memory device including anti-fuse element and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12340844B2Jun 24, 2025
Phase-change memory cell and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11955441B2Apr 9, 2024
Interconnect structure and forming method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11302654B2Apr 12, 2022
Method of fabricating semiconductor device including dummy via anchored to dummy metal layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US9601373B2Mar 21, 2017
Semiconductor device and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9356016B2May 31, 2016
Semiconductor device and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10431541B2Oct 1, 2019
Semiconductor device, layout pattern and method for manufacturing an integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10475742B2Nov 12, 2019
Method for forming semiconductor device structure having conductive structure with twin boundaries
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US10283450B2May 7, 2019
Method for forming semiconductor device structure having conductive structure with twin boundaries
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US9941159B2Apr 10, 2018
Method of manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US9875964B2Jan 23, 2018
Semiconductor device components and methods
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US9761523B2Sep 12, 2017
Interconnect structure with twin boundaries and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US9449919B2Sep 20, 2016
Semiconductor device, layout design and method for manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US9734271B2Aug 15, 2017
Method of determining galvanic corrosion and interconnect structure in a semiconductor device for prevention of galvanic corrosion
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations45
TAIWAN SEMICONDUCTOR MFG
8 patentsUS7235424B2Jun 26, 2007
Method and apparatus for enhanced CMP planarization using surrounded dummy design
TAIWAN SEMICONDUCTOR MFG150 citations98
US7893459B2Feb 22, 2011
Seal ring structures with reduced moisture-induced reliability degradation
TAIWAN SEMICONDUCTOR MFG33 citations92
US8729705B2May 20, 2014
Seal ring structures with reduced moisture-induced reliability degradation
TAIWAN SEMICONDUCTOR MFG5 citations84
US7646207B2Jan 12, 2010
Method for measuring a property of interconnections and structure for the same
TAIWAN SEMICONDUCTOR MFG7 citations69
US8379365B2Feb 19, 2013
Metal oxide metal capacitor with slot vias
TAIWAN SEMICONDUCTOR MFG3 citations62
US7816256B2Oct 19, 2010
Process for improving the reliability of interconnect structures and resulting structure
TAIWAN SEMICONDUCTOR MFG4 citations62
US7135406B2Nov 14, 2006
Method for damascene formation using plug materials having varied etching rates
TAIWAN SEMICONDUCTOR MFG4 citations60
US7667289B2Feb 23, 2010
Fuse structure having a tortuous metal fuse line
TAIWAN SEMICONDUCTOR MFG1 citations52
LIN JIAN-HONG
6 patentsUS8208084B2Jun 26, 2012
Array substrate with test shorting bar and display panel thereof
LIN JIAN-HONG94 citations97
US8541264B2Sep 24, 2013
Method for forming semiconductor structure having protection layer for preventing laser damage
LIN JIAN-HONG7 citations83
US8508503B2Aug 13, 2013
Touch panel and method of reducing noise coupled by a common voltage of a touch panel
LIN JIAN-HONG13 citations78
US8755000B2Jun 17, 2014
Display panel with test shorting bar
LIN JIAN-HONG2 citations62
US8242576B2Aug 14, 2012
Protection layer for preventing laser damage on semiconductor devices
LIN JIAN-HONG4 citations61
US8848374B2Sep 30, 2014
Method and structure for dissipating heat away from a resistor having neighboring devices and interconnects
LIN JIAN-HONG1 citations45
SHENZHEN CHINA STAR OPTOELECT
2 patentsLIN BI-LING
1 patentWUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD
1 patentAU OPTRONICS CORP
1 patentCHEN HSIEN-WEI
1 patentWANG CHIEN-JUNG
1 patentLIAO YI-SUEI
1 patentWANG CHIN-SHAN
1 patentShowing the top 50 of 52 patents by PatentIndex Score.