Inventor
CHOI JEONG-HYUK
KR64 patents
⚠️ This page may combine multiple inventors who share the name “CHOI JEONG-HYUK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
49 patentsUS6417538B1Jul 9, 2002
Nonvolative semiconductor memory device with high impurity concentration under field oxide layer
SAMSUNG ELECTRONICS CO LTD105 citations98
US5943262AAug 24, 1999
Non-volatile memory device and method for operating and fabricating the same
SAMSUNG ELECTRONICS CO LTD92 citations98
US6028788AFeb 22, 2000
Flash memory device
SAMSUNG ELECTRONICS CO LTD150 citations97
US6661707B2Dec 9, 2003
Method of programming NAND-type flash memory
SAMSUNG ELECTRONICS CO LTD91 citations96
US6487117B1Nov 26, 2002
Method for programming NAND-type flash memory device using bulk bias
SAMSUNG ELECTRONICS CO LTD57 citations96
US6365457B1Apr 2, 2002
Method for manufacturing nonvolatile memory device using self-aligned source process
SAMSUNG ELECTRONICS CO LTD74 citations96
US6157575ADec 5, 2000
Nonvolatile memory device and operating method thereof
SAMSUNG ELECTRONICS CO LTD68 citations96
US6130838AOct 10, 2000
Structure nonvolatile semiconductor memory cell array and method for fabricating same
SAMSUNG ELECTRONICS CO LTD79 citations96
US5590072ADec 31, 1996
Nonvolatile semiconductor memory device
SAMSUNG ELECTRONICS CO LTD61 citations96
US6483749B1Nov 19, 2002
Nonvolatile memory device having bulk bias contact structure in cell array region
SAMSUNG ELECTRONICS CO LTD86 citations95
US6861685B2Mar 1, 2005
Floating trap type nonvolatile memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD24 citations93
US6337245B1Jan 8, 2002
Method for fabricating flash memory device and flash memory device fabricated thereby
SAMSUNG ELECTRONICS CO LTD39 citations93
US6330187B1Dec 11, 2001
Nonvolatile memory device and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD36 citations93
US6197639B1Mar 6, 2001
Method for manufacturing NOR-type flash memory device
SAMSUNG ELECTRONICS CO LTD86 citations93
US5834352ANov 10, 1998
Methods of forming integrated circuits containing high and low voltage field effect transistors therein
SAMSUNG ELECTRONICS CO LTD45 citations93
US5789294AAug 4, 1998
Manufacturing method of nonvolatile memory
SAMSUNG ELECTRONICS CO LTD31 citations93
US5729491AMar 17, 1998
Nonvolatile integrated circuit memory devices having ground interconnect lattices with reduced lateral dimensions
SAMSUNG ELECTRONICS CO LTD21 citations93
US6927447B2Aug 9, 2005
Flash memory devices having a sloped trench isolation structure
SAMSUNG ELECTRONICS CO LTD20 citations92
US6867453B2Mar 15, 2005
Memory device and fabrication method thereof
SAMSUNG ELECTRONICS CO LTD28 citations92
US6204122B1Mar 20, 2001
Methods of forming nonvolatile integrated circuit memory devices having high capacitive coupling ratios
SAMSUNG ELECTRONICS CO LTD36 citations92
US5841163ANov 24, 1998
Integrated circuit memory devices having wide and narrow channel stop layers
SAMSUNG ELECTRONICS CO LTD17 citations92
US5792696AAug 11, 1998
Nonvolatile memory device and manufacturing method thereof
SAMSUNG ELECTRONICS CO LTD18 citations92
US5712178AJan 27, 1998
Non-volatile semiconductor memory device and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD42 citations92
US5712588AJan 27, 1998
Fuse element for a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD42 citations92
US6153469ANov 28, 2000
Method of fabricating cell of flash memory device
SAMSUNG ELECTRONICS CO LTD21 citations91
US5663084ASep 2, 1997
Method for manufacturing nonvolatile semiconductor memory device
SAMSUNG ELECTRONICS CO LTD30 citations91
US5472892ADec 5, 1995
Method of making a non-volatile floating gate memory device with peripheral transistor
SAMSUNG ELECTRONICS CO LTD47 citations89
US7745287B2Jun 29, 2010
Floating trap type nonvolatile memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD11 citations84
US7714378B2May 11, 2010
Nonvolatile semiconductor integrated circuit devices and fabrication methods thereof
SAMSUNG ELECTRONICS CO LTD10 citations84
US6347053B1Feb 12, 2002
Nonviolatile memory device having improved threshold voltages in erasing and programming operations
SAMSUNG ELECTRONICS CO LTD17 citations84
US6204530B1Mar 20, 2001
Flash-type nonvolatile semiconductor memory devices for preventing overerasure
SAMSUNG ELECTRONICS CO LTD18 citations84
US7829931B2Nov 9, 2010
Nonvolatile memory devices having control electrodes configured to inhibit parasitic coupling capacitance
SAMSUNG ELECTRONICS CO LTD9 citations83
US7589374B2Sep 15, 2009
Semiconductor device and related fabrication method
SAMSUNG ELECTRONICS CO LTD7 citations74
US7223659B2May 29, 2007
Memory device and fabrication method thereof
SAMSUNG ELECTRONICS CO LTD6 citations74
US6967373B2Nov 22, 2005
Two-bit charge trap nonvolatile memory device and methods of operating and fabrication the same
SAMSUNG ELECTRONICS CO LTD5 citations74
US6903406B2Jun 7, 2005
Cells of nonvolatile memory device with high inter-layer dielectric constant
SAMSUNG ELECTRONICS CO LTD10 citations74
US6482708B2Nov 19, 2002
Nonvolatile memory device and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD10 citations74
US6406955B1Jun 18, 2002
Method for manufacturing CMOS devices having transistors with mutually different punch-through voltage characteristics
SAMSUNG ELECTRONICS CO LTD12 citations74
US6312990B1Nov 6, 2001
Structure nonvolatile semiconductor memory cell array and method for fabricating same
SAMSUNG ELECTRONICS CO LTD6 citations74
US6091116AJul 18, 2000
CMOS device and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD8 citations74
US5991203ANov 23, 1999
Circuit and method of erasing a nonvolatile semiconductor memory
SAMSUNG ELECTRONICS CO LTD9 citations74
US5790457AAug 4, 1998
Nonvolatile integrated circuit memory devices having ground interconnect lattices with reduced lateral dimensions
SAMSUNG ELECTRONICS CO LTD14 citations74
US5932920AAug 3, 1999
Nonvolatile memory device and manufacturing method thereof
SAMSUNG ELECTRONICS CO LTD7 citations73
US5830790ANov 3, 1998
High voltage transistor of semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD12 citations73
US6281076B1Aug 28, 2001
Method for manufacturing nonvolatile memory device capable of preventing damage to side walls of stacked gate and active region
SAMSUNG ELECTRONICS CO LTD11 citations70
US7687860B2Mar 30, 2010
Semiconductor device including impurity regions having different cross-sectional shapes
SAMSUNG ELECTRONICS CO LTD5 citations63
US7538385B2May 26, 2009
Memory device and fabrication method thereof
SAMSUNG ELECTRONICS CO LTD3 citations63
US7494871B2Feb 24, 2009
Semiconductor memory devices and methods for forming the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US7449763B2Nov 11, 2008
Method of fabricating cell of nonvolatile memory device with floating gate
SAMSUNG ELECTRONICS CO LTD1 citations63
SAMSUNG ELECTRIC
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