Inventor

ISHIKAWA NOBUHIRO

JP29 patents

⚠️ This page may combine multiple inventors who share the name “ISHIKAWA NOBUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ISHIKAWA NOBUHIRO

MITUTOYO CORP

Measuring method and measuring instrument

Touch signal probe

DC level transition detecting circuit for sensor devices

Coordinate correction method and coordinate measuring machine

Coordinate measuring machine and coordinate correction method

Coordinate measuring machine and method for calculating correction matrix by coordinate measuring machine

Shape measuring apparatus and shape measurement error correction method

Shape measuring machine and method of correcting shape measurement error

Image sensor, attitude detector, contact probe, and multi-sensing probe

Measuring apparatus, method of measuring surface texture and computer readable medium having program for measuring surface texture

Position control device, measuring device and machining device

Measuring probe

Surface-profile measuring instrument

Coordinate measuring machine and coordinate correction method

Form measuring machine and form measuring method

Method of correcting measurement error of shape measuring apparatus, and shape measuring apparatus

Shape measuring machine and method of correcting shape measurement error

Measuring probe

Method and apparatus for measuring optical wavelength

Amplitude detecting device

Amplitude-detecting method and circuit

Non-directional touch signal probe

Sensor signal contact detector circuit

Control device

NAKAGAWA HIDEYUKI

Coordinate measuring machine

Controller

TAIYO HOLDINGS CO LTD

Poly(phenylene ether), curable composition containing poly(phenylene ether), dry film, prepreg, cured object, laminate, and electronic component

Curable resin multilayer body, dry film, cured product and electronic component

ISHIKAWA NOBUHIRO

Coordinate measuring machine