Inventor

MONSALLUT PIERRE

FR2 patents

Patents

2 patents

US6259530B1Jul 10, 2001

Method and device for measuring the depths of bottoms of craters in a physico-chemical analyzer

CAMECA15 citations75

US7049588B2May 23, 2006

Device for measuring the emission of X-rays produced by an object exposed to an electron beam

CAMECA2 citations52