Inventor
LING ZHI-MIN
US20 patents
⚠️ This page may combine multiple inventors who share the name “LING ZHI-MIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
XILINX INC
11 patentsUS6950771B1Sep 27, 2005
Correlation of electrical test data with physical defect data
XILINX INC444 citations95
US6891395B2May 10, 2005
Application-specific testing methods for programmable logic devices
XILINX INC43 citations95
US6817006B1Nov 9, 2004
Application-specific testing methods for programmable logic devices
XILINX INC51 citations95
US6594610B1Jul 15, 2003
Fault emulation testing of programmable logic devices
XILINX INC36 citations91
US6664808B2Dec 16, 2003
Method of using partially defective programmable logic devices
XILINX INC26 citations87
US7020860B1Mar 28, 2006
Method for monitoring and improving integrated circuit fabrication using FPGAs
XILINX INC15 citations84
US7227364B1Jun 5, 2007
Test circuit for and method of identifying a defect in an integrated circuit
XILINX INC15 citations83
US7246285B1Jul 17, 2007
Method of automatic fault isolation in a programmable logic device
XILINX INC12 citations82
US7626874B1Dec 1, 2009
Method and apparatus for testing a memory device with a redundant self repair feature
XILINX INC9 citations78
US7145344B2Dec 5, 2006
Method and circuits for localizing defective interconnect resources in programmable logic devices
XILINX INC6 citations73
US6376131B1Apr 23, 2002
Methods and structures for protecting reticles from ESD failure
XILINX INC10 citations73
ADVANCED MICRO DEVICES INC
8 patentsUS5930138AJul 27, 1999
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs
ADVANCED MICRO DEVICES INC85 citations96
US5598341AJan 28, 1997
Real-time in-line defect disposition and yield forecasting system
ADVANCED MICRO DEVICES INC82 citations94
US6001663ADec 14, 1999
Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same
ADVANCED MICRO DEVICES INC46 citations92
US5821765AOct 13, 1998
Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same
ADVANCED MICRO DEVICES INC20 citations92
US5761065AJun 2, 1998
Arrangement and method for detecting sequential processing effects in manufacturing
ADVANCED MICRO DEVICES INC61 citations92
US5716856AFeb 10, 1998
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs
ADVANCED MICRO DEVICES INC17 citations92
US5670891ASep 23, 1997
Structures to extract defect size information of poly and source-drain semiconductor devices and method for making the same
ADVANCED MICRO DEVICES INC16 citations82
US5963780AOct 5, 1999
Method for detecting defect sizes in polysilicon and source-drain semiconductor devices
ADVANCED MICRO DEVICES INC5 citations74