Inventor
QUEK ELGIN
SG105 patents
⚠️ This page may combine multiple inventors who share the name “QUEK ELGIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHARTERED SEMICONDUCTOR MFG
32 patentsUS6300177B1Oct 9, 2001
Method to form transistors with multiple threshold voltages (VT) using a combination of different work function gate materials
CHARTERED SEMICONDUCTOR MFG175 citations99
US7592270B2Sep 22, 2009
Modulation of stress in stress film through ion implantation and its application in stress memorization technique
CHARTERED SEMICONDUCTOR MFG58 citations98
US6461900B1Oct 8, 2002
Method to form a self-aligned CMOS inverter using vertical device integration
CHARTERED SEMICONDUCTOR MFG141 citations98
US6313008B1Nov 6, 2001
Method to form a balloon shaped STI using a micro machining technique to remove heavily doped silicon
CHARTERED SEMICONDUCTOR MFG90 citations98
US7169675B2Jan 30, 2007
Material architecture for the fabrication of low temperature transistor
CHARTERED SEMICONDUCTOR MFG164 citations97
US6747314B2Jun 8, 2004
Method to form a self-aligned CMOS inverter using vertical device integration
CHARTERED SEMICONDUCTOR MFG93 citations97
US6632712B1Oct 14, 2003
Method of fabricating variable length vertical transistors
CHARTERED SEMICONDUCTOR MFG89 citations97
US6946349B1Sep 20, 2005
Method for integrating a SONOS gate oxide transistor into a logic/analog integrated circuit having several gate oxide thicknesses
CHARTERED SEMICONDUCTOR MFG113 citations96
US6406945B1Jun 18, 2002
Method for forming a transistor gate dielectric with high-K and low-K regions
CHARTERED SEMICONDUCTOR MFG59 citations96
US6403485B1Jun 11, 2002
Method to form a low parasitic capacitance pseudo-SOI CMOS device
CHARTERED SEMICONDUCTOR MFG66 citations96
US6709934B2Mar 23, 2004
Method for forming variable-K gate dielectric
CHARTERED SEMICONDUCTOR MFG26 citations93
US6511884B1Jan 28, 2003
Method to form and/or isolate vertical transistors
CHARTERED SEMICONDUCTOR MFG48 citations93
US6468877B1Oct 22, 2002
Method to form an air-gap under the edges of a gate electrode by using disposable spacer/liner
CHARTERED SEMICONDUCTOR MFG53 citations93
US6455377B1Sep 24, 2002
Method to form very high mobility vertical channel transistor by selective deposition of SiGe or multi-quantum wells (MQWs)
CHARTERED SEMICONDUCTOR MFG21 citations93
US6436770B1Aug 20, 2002
Method to control the channel length of a vertical transistor by first forming channel using selective epi and source/drain using implantation
CHARTERED SEMICONDUCTOR MFG45 citations93
US6417056B1Jul 9, 2002
Method to form low-overlap-capacitance transistors by forming microtrench at the gate edge
CHARTERED SEMICONDUCTOR MFG51 citations93
US6306715B1Oct 23, 2001
Method to form smaller channel with CMOS device by isotropic etching of the gate materials
CHARTERED SEMICONDUCTOR MFG46 citations93
US6566208B2May 20, 2003
Method to form elevated source/drain using poly spacer
CHARTERED SEMICONDUCTOR MFG22 citations89
US6924180B2Aug 2, 2005
Method of forming a pocket implant region after formation of composite insulator spacers
CHARTERED SEMICONDUCTOR MFG13 citations84
US6841441B2Jan 11, 2005
Method to produce dual gates (one metal and one poly or metal silicide) for CMOS devices using sputtered metal deposition, metallic ion implantation, or silicon implantation, and laser annealing
CHARTERED SEMICONDUCTOR MFG12 citations84
US6664153B2Dec 16, 2003
Method to fabricate a single gate with dual work-functions
CHARTERED SEMICONDUCTOR MFG18 citations84
US6610575B1Aug 26, 2003
Forming dual gate oxide thickness on vertical transistors by ion implantation
CHARTERED SEMICONDUCTOR MFG16 citations84
US6461887B1Oct 8, 2002
Method to form an inverted staircase STI structure by etch-deposition-etch and selective epitaxial growth
CHARTERED SEMICONDUCTOR MFG18 citations84
US6429109B1Aug 6, 2002
Method to form high k dielectric and silicide to reduce poly depletion by using a sacrificial metal between oxide and gate
CHARTERED SEMICONDUCTOR MFG18 citations84
US6380088B1Apr 30, 2002
Method to form a recessed source drain on a trench side wall with a replacement gate technique
CHARTERED SEMICONDUCTOR MFG19 citations84
US7148522B2Dec 12, 2006
Thyristor-based SRAM
CHARTERED SEMICONDUCTOR MFG11 citations83
US7727856B2Jun 1, 2010
Selective STI stress relaxation through ion implantation
CHARTERED SEMICONDUCTOR MFG10 citations82
US7071069B2Jul 4, 2006
Shallow amorphizing implant for gettering of deep secondary end of range defects
CHARTERED SEMICONDUCTOR MFG18 citations82
US6605501B1Aug 12, 2003
Method of fabricating CMOS device with dual gate electrode
CHARTERED SEMICONDUCTOR MFG14 citations82
US6815355B2Nov 9, 2004
Method of integrating L-shaped spacers in a high performance CMOS process via use of an oxide-nitride-doped oxide spacer
CHARTERED SEMICONDUCTOR MFG12 citations74
US6541327B1Apr 1, 2003
Method to form self-aligned source/drain CMOS device on insulated staircase oxide
CHARTERED SEMICONDUCTOR MFG8 citations74
US6436774B1Aug 20, 2002
Method for forming variable-K gate dielectric
CHARTERED SEMICONDUCTOR MFG8 citations74
TOH ENG HUAT
8 patentsUS8440533B2May 14, 2013
Self-aligned contact for replacement metal gate and silicide last processes
TOH ENG HUAT33 citations93
US8502279B2Aug 6, 2013
Nano-electro-mechanical system (NEMS) structures with actuatable semiconductor fin on bulk substrates
TOH ENG HUAT24 citations92
US8492235B2Jul 23, 2013
FinFET with stressors
TOH ENG HUAT29 citations92
US9034711B2May 19, 2015
LDMOS with two gate stacks having different work functions for improved breakdown voltage
TOH ENG HUAT5 citations84
US8889494B2Nov 18, 2014
Finfet
TOH ENG HUAT14 citations84
US8748271B2Jun 10, 2014
LDMOS with improved breakdown voltage
TOH ENG HUAT13 citations84
US8698118B2Apr 15, 2014
Compact RRAM device and methods of making same
TOH ENG HUAT9 citations84
US9276041B2Mar 1, 2016
Three dimensional RRAM device, and methods of making same
TOH ENG HUAT3 citations73
GLOBALFOUNDRIES SG PTE LTD
7 patentsUS8368127B2Feb 5, 2013
Method of fabricating a silicon tunneling field effect transistor (TFET) with high drive current
GLOBALFOUNDRIES SG PTE LTD23 citations93
US9431497B2Aug 30, 2016
Transistor devices having an anti-fuse configuration and methods of forming the same
GLOBALFOUNDRIES SG PTE LTD15 citations84
US9219147B2Dec 22, 2015
LDMOS with improved breakdown voltage
GLOBALFOUNDRIES SG PTE LTD6 citations84
US8975708B2Mar 10, 2015
Semiconductor device with reduced contact resistance and method of manufacturing thereof
GLOBALFOUNDRIES SG PTE LTD6 citations84
US9825223B2Nov 21, 2017
Fin selector with gated RRAM
GLOBALFOUNDRIES SG PTE LTD2 citations73
US9406801B2Aug 2, 2016
FinFET
GLOBALFOUNDRIES SG PTE LTD5 citations73
US9368386B2Jun 14, 2016
Corner transistor suppression
GLOBALFOUNDRIES SG PTE LTD3 citations73
TAN SHYUE SENG
3 patentsShowing the top 50 of 105 patents by PatentIndex Score.