P

Inventor

QUEK ELGIN

SG105 patents
⚠️ This page may combine multiple inventors who share the name “QUEK ELGIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHARTERED SEMICONDUCTOR MFG

32 patents
US6300177B1Oct 9, 2001

Method to form transistors with multiple threshold voltages (VT) using a combination of different work function gate materials

CHARTERED SEMICONDUCTOR MFG175 citations99
US7592270B2Sep 22, 2009

Modulation of stress in stress film through ion implantation and its application in stress memorization technique

CHARTERED SEMICONDUCTOR MFG58 citations98
US6461900B1Oct 8, 2002

Method to form a self-aligned CMOS inverter using vertical device integration

CHARTERED SEMICONDUCTOR MFG141 citations98
US6313008B1Nov 6, 2001

Method to form a balloon shaped STI using a micro machining technique to remove heavily doped silicon

CHARTERED SEMICONDUCTOR MFG90 citations98
US7169675B2Jan 30, 2007

Material architecture for the fabrication of low temperature transistor

CHARTERED SEMICONDUCTOR MFG164 citations97
US6747314B2Jun 8, 2004

Method to form a self-aligned CMOS inverter using vertical device integration

CHARTERED SEMICONDUCTOR MFG93 citations97
US6632712B1Oct 14, 2003

Method of fabricating variable length vertical transistors

CHARTERED SEMICONDUCTOR MFG89 citations97
US6946349B1Sep 20, 2005

Method for integrating a SONOS gate oxide transistor into a logic/analog integrated circuit having several gate oxide thicknesses

CHARTERED SEMICONDUCTOR MFG113 citations96
US6406945B1Jun 18, 2002

Method for forming a transistor gate dielectric with high-K and low-K regions

CHARTERED SEMICONDUCTOR MFG59 citations96
US6403485B1Jun 11, 2002

Method to form a low parasitic capacitance pseudo-SOI CMOS device

CHARTERED SEMICONDUCTOR MFG66 citations96
US6709934B2Mar 23, 2004

Method for forming variable-K gate dielectric

CHARTERED SEMICONDUCTOR MFG26 citations93
US6511884B1Jan 28, 2003

Method to form and/or isolate vertical transistors

CHARTERED SEMICONDUCTOR MFG48 citations93
US6468877B1Oct 22, 2002

Method to form an air-gap under the edges of a gate electrode by using disposable spacer/liner

CHARTERED SEMICONDUCTOR MFG53 citations93
US6455377B1Sep 24, 2002

Method to form very high mobility vertical channel transistor by selective deposition of SiGe or multi-quantum wells (MQWs)

CHARTERED SEMICONDUCTOR MFG21 citations93
US6436770B1Aug 20, 2002

Method to control the channel length of a vertical transistor by first forming channel using selective epi and source/drain using implantation

CHARTERED SEMICONDUCTOR MFG45 citations93
US6417056B1Jul 9, 2002

Method to form low-overlap-capacitance transistors by forming microtrench at the gate edge

CHARTERED SEMICONDUCTOR MFG51 citations93
US6306715B1Oct 23, 2001

Method to form smaller channel with CMOS device by isotropic etching of the gate materials

CHARTERED SEMICONDUCTOR MFG46 citations93
US6566208B2May 20, 2003

Method to form elevated source/drain using poly spacer

CHARTERED SEMICONDUCTOR MFG22 citations89
US6924180B2Aug 2, 2005

Method of forming a pocket implant region after formation of composite insulator spacers

CHARTERED SEMICONDUCTOR MFG13 citations84
US6841441B2Jan 11, 2005

Method to produce dual gates (one metal and one poly or metal silicide) for CMOS devices using sputtered metal deposition, metallic ion implantation, or silicon implantation, and laser annealing

CHARTERED SEMICONDUCTOR MFG12 citations84
US6664153B2Dec 16, 2003

Method to fabricate a single gate with dual work-functions

CHARTERED SEMICONDUCTOR MFG18 citations84
US6610575B1Aug 26, 2003

Forming dual gate oxide thickness on vertical transistors by ion implantation

CHARTERED SEMICONDUCTOR MFG16 citations84
US6461887B1Oct 8, 2002

Method to form an inverted staircase STI structure by etch-deposition-etch and selective epitaxial growth

CHARTERED SEMICONDUCTOR MFG18 citations84
US6429109B1Aug 6, 2002

Method to form high k dielectric and silicide to reduce poly depletion by using a sacrificial metal between oxide and gate

CHARTERED SEMICONDUCTOR MFG18 citations84
US6380088B1Apr 30, 2002

Method to form a recessed source drain on a trench side wall with a replacement gate technique

CHARTERED SEMICONDUCTOR MFG19 citations84
US7148522B2Dec 12, 2006

Thyristor-based SRAM

CHARTERED SEMICONDUCTOR MFG11 citations83
US7727856B2Jun 1, 2010

Selective STI stress relaxation through ion implantation

CHARTERED SEMICONDUCTOR MFG10 citations82
US7071069B2Jul 4, 2006

Shallow amorphizing implant for gettering of deep secondary end of range defects

CHARTERED SEMICONDUCTOR MFG18 citations82
US6605501B1Aug 12, 2003

Method of fabricating CMOS device with dual gate electrode

CHARTERED SEMICONDUCTOR MFG14 citations82
US6815355B2Nov 9, 2004

Method of integrating L-shaped spacers in a high performance CMOS process via use of an oxide-nitride-doped oxide spacer

CHARTERED SEMICONDUCTOR MFG12 citations74
US6541327B1Apr 1, 2003

Method to form self-aligned source/drain CMOS device on insulated staircase oxide

CHARTERED SEMICONDUCTOR MFG8 citations74
US6436774B1Aug 20, 2002

Method for forming variable-K gate dielectric

CHARTERED SEMICONDUCTOR MFG8 citations74

TOH ENG HUAT

8 patents

GLOBALFOUNDRIES SG PTE LTD

7 patents

TAN SHYUE SENG

3 patents

Showing the top 50 of 105 patents by PatentIndex Score.