P

Inventor

PAN YANG

SG168 patents
⚠️ This page may combine multiple inventors who share the name “PAN YANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHARTERED SEMICONDUCTOR MFG

31 patents
US6300177B1Oct 9, 2001

Method to form transistors with multiple threshold voltages (VT) using a combination of different work function gate materials

CHARTERED SEMICONDUCTOR MFG175 citations99
US5595919AJan 21, 1997

Method of making self-aligned halo process for reducing junction capacitance

CHARTERED SEMICONDUCTOR MFG175 citations99
US6461900B1Oct 8, 2002

Method to form a self-aligned CMOS inverter using vertical device integration

CHARTERED SEMICONDUCTOR MFG141 citations98
US6313008B1Nov 6, 2001

Method to form a balloon shaped STI using a micro machining technique to remove heavily doped silicon

CHARTERED SEMICONDUCTOR MFG90 citations98
US5667424ASep 16, 1997

New chemical mechanical planarization (CMP) end point detection apparatus

CHARTERED SEMICONDUCTOR MFG125 citations98
US6747314B2Jun 8, 2004

Method to form a self-aligned CMOS inverter using vertical device integration

CHARTERED SEMICONDUCTOR MFG93 citations97
US6406945B1Jun 18, 2002

Method for forming a transistor gate dielectric with high-K and low-K regions

CHARTERED SEMICONDUCTOR MFG59 citations96
US6403485B1Jun 11, 2002

Method to form a low parasitic capacitance pseudo-SOI CMOS device

CHARTERED SEMICONDUCTOR MFG66 citations96
US5869396AFeb 9, 1999

Method for forming a polycide gate electrode

CHARTERED SEMICONDUCTOR MFG86 citations96
US5750435AMay 12, 1998

Method for minimizing the hot carrier effect in N-MOSFET devices

CHARTERED SEMICONDUCTOR MFG68 citations96
US5599726AFeb 4, 1997

Method of making a conductive spacer lightly doped drain (LDD) for hot carrier effect (HCE) control

CHARTERED SEMICONDUCTOR MFG47 citations96
US6159781ADec 12, 2000

Way to fabricate the self-aligned T-shape gate to reduce gate resistivity

CHARTERED SEMICONDUCTOR MFG60 citations95
US5667629ASep 16, 1997

Method and apparatus for determination of the end point in chemical mechanical polishing

CHARTERED SEMICONDUCTOR MFG75 citations95
US6709934B2Mar 23, 2004

Method for forming variable-K gate dielectric

CHARTERED SEMICONDUCTOR MFG26 citations93
US6511884B1Jan 28, 2003

Method to form and/or isolate vertical transistors

CHARTERED SEMICONDUCTOR MFG48 citations93
US6468877B1Oct 22, 2002

Method to form an air-gap under the edges of a gate electrode by using disposable spacer/liner

CHARTERED SEMICONDUCTOR MFG53 citations93
US6455377B1Sep 24, 2002

Method to form very high mobility vertical channel transistor by selective deposition of SiGe or multi-quantum wells (MQWs)

CHARTERED SEMICONDUCTOR MFG21 citations93
US6436770B1Aug 20, 2002

Method to control the channel length of a vertical transistor by first forming channel using selective epi and source/drain using implantation

CHARTERED SEMICONDUCTOR MFG45 citations93
US6417056B1Jul 9, 2002

Method to form low-overlap-capacitance transistors by forming microtrench at the gate edge

CHARTERED SEMICONDUCTOR MFG51 citations93
US6306715B1Oct 23, 2001

Method to form smaller channel with CMOS device by isotropic etching of the gate materials

CHARTERED SEMICONDUCTOR MFG46 citations93
US6300653B1Oct 9, 2001

Method for forming a high areal capacitance planar capacitor

CHARTERED SEMICONDUCTOR MFG22 citations93
US5814863ASep 29, 1998

Substrate with gate electrode polysilicon/gate oxide stack covered with fluorinated silicon oxide layer and fluorinated corners of gate oxide layer

CHARTERED SEMICONDUCTOR MFG22 citations93
US5813664ASep 29, 1998

Back-end capacitor with high unit capacitance

CHARTERED SEMICONDUCTOR MFG25 citations93
US5760435AJun 2, 1998

Use of spacers as floating gates in EEPROM with doubled storage efficiency

CHARTERED SEMICONDUCTOR MFG44 citations93
US5691252ANov 25, 1997

Method of making low profile shallow trench double polysilicon capacitor

CHARTERED SEMICONDUCTOR MFG18 citations93
US5672525ASep 30, 1997

Polysilicon gate reoxidation in a gas mixture of oxygen and nitrogen trifluoride gas by rapid thermal processing to improve hot carrier immunity

CHARTERED SEMICONDUCTOR MFG34 citations93
US5670410ASep 23, 1997

Method of forming integrated CMP stopper and analog capacitor

CHARTERED SEMICONDUCTOR MFG46 citations93
US5652177AJul 29, 1997

Method for fabricating a planar field oxide region

CHARTERED SEMICONDUCTOR MFG21 citations93
US6291307B1Sep 18, 2001

Method and structure to make planar analog capacitor on the top of a STI structure

CHARTERED SEMICONDUCTOR MFG36 citations92
US6566208B2May 20, 2003

Method to form elevated source/drain using poly spacer

CHARTERED SEMICONDUCTOR MFG22 citations89
US6297106B1Oct 2, 2001

Transistors with low overlap capacitance

CHARTERED SEMICONDUCTOR MFG46 citations87

LAM RES CORP

7 patents

INVENSENSE INC

2 patents

PAN YANG

2 patents

MILLENNIUM BIOTHERAPEUTICS INC

2 patents

HUAWEI DEVICE CO LTD

1 patent

(unassigned)

1 patent

CHARTERED SEMICONDUCTOR MFG CO

1 patent

CHARTERED SEMICONDUCTOR

1 patent

MILLENIUM BIOTHERAPEUTICS INC

1 patent

CHARTERED SEMICONDUCTION MANUF

1 patent

Showing the top 50 of 168 patents by PatentIndex Score.