Inventor

KRISHNAN SHANKAR

US123 patents

⚠️ This page may combine multiple inventors who share the name “KRISHNAN SHANKAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KRISHNAN SHANKAR

KLA TENCOR CORP

Optical metrology with reduced sensitivity to grating anomalies

Dynamically adjustable semiconductor metrology system

Metrology systems and methods for high aspect ratio and large lateral dimension structures

Measurement of thin film porosity

Purge gas flow control for high-precision film measurements using ellipsometry and reflectometry

Multiple angles of incidence semiconductor metrology systems and methods

Azimuth angle measurement

Measurement of semiconductor structures with capillary condensation

Small spot size spectroscopic ellipsometer

Measurement of multiple patterning parameters

Measurement of multiple patterning parameters

Spectral reflectometry for in-situ process monitoring and control

Simultaneous multi-angle spectroscopy

Multiple angles of incidence semiconductor metrology systems and methods

Measurement of multiple patterning parameters

Critical dimension measurements with gaseous adsorption

Infrared spectroscopic reflectometer for measurement of high aspect ratio structures

Porosity measurement of semiconductor structures

Systems and methods for extended infrared spectroscopic ellipsometry

QUALCOMM INC

Configuring a user equipment for machine learning

Application, services, and network slice based measurements for minimization of drive test reporting

Data collection reporting for non-terrestrial network cells

AI/ML based mobility related prediction for handover

Performance indicators for combinations of machine learning models

Machine learning model configuration in wireless networks

Quality of experience measurement and reporting

Handover optimization based on UE mobility prediction

Integrated access and backhaul data collection

Model discovery and selection for cooperative machine learning in cellular networks

KLA TENCOR TECH CORP

Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals

Systems and methods for measuring stress in a specimen

Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system

Concurrent measurement and cleaning of thin films on silicon-on-insulator (SOI)

KLA CORP

Monolithic optical retarder

Overlay metrology on bonded wafers

Mid-infrared spectroscopy for measurement of high aspect ratio structures

INTEL CORP

Recirculating dielectric fluid cooling

Ultrasound assisted immersion cooling

KRISHNAN SHANKAR

Reconfigurable spectroscopic ellipsometer

Global registration of multiple 3D point sets via optimization on a manifold

BATTELLE MEMORIAL INSTITUTE

Solar thermochemical processing system and method

Solar thermochemical processing system and method

HOUSTON ADVANCED RES CENTER

Method and apparatus to simultaneously measure emissivities and thermodynamic temperatures of remote objects

WANG HAIMING

Selectably configurable multiple mode spectroscopic ellipsometry

CONTAINERLESS RESEARCH INC

Hyperspectral polarization profiler for remote sensing

AT & T IP II LP

Global registration of multiple 3D point sets via optimization on a manifold

AT & T CORP

Map simplification system

ALCATEL LUCENT USA INC

Spreading thermoelectric coolers

WEGENG ROBERT S

Solar thermochemical processing system and method

NORTH STEPHEN C

Apparatus and method for modification of telecommunication video content