Inventor
YAMAGISHI WATARU
20 patents
⚠️ This page may combine multiple inventors who share the name “YAMAGISHI WATARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJITSU LTD
10 patentsUS6586044B1Jul 1, 2003
Method for manufacturing a magnetic hard disk having concentric magnetic tracks with flat surface
FUJITSU LTD53 citations95
US6583957B1Jun 24, 2003
Magnetic hard disk having concentric magnetic tracks with flat surface and fabrication method thereof
FUJITSU LTD72 citations95
US6147488ANov 14, 2000
Measurement method of time dependent magnetic remanence in a recording medium
FUJITSU LTD21 citations92
US5287620AFeb 22, 1994
Process of producing multiple-layer glass-ceramic circuit board
FUJITSU LTD30 citations92
US5676781AOct 14, 1997
Method of producing a multi-layered ceramic circuit board
FUJITSU LTD9 citations74
US4710242ADec 1, 1987
Material for temperature sensitive elements
FUJITSU LTD7 citations74
US4459248AJul 10, 1984
Process and apparatus for producing a temperature sensitive element
FUJITSU LTD7 citations74
US4347201AAug 31, 1982
Process and apparatus for producing a temperature sensitive element
FUJITSU LTD6 citations74
US6773782B2Aug 10, 2004
Magnetic memory medium having a magnetic film laminated on a substrate and a non-magnetic film formed thereon, and method of manufacturing the same
FUJITSU LTD7 citations73
US4925502AMay 15, 1990
Iron-cobalt type soft magnetic material
FUJITSU LTD6 citations72
HITACHI LTD
6 patentsUS6247348B1Jun 19, 2001
Apparatus for and method of testing dynamic characteristics of components of vehicle
HITACHI LTD81 citations96
US6341258B1Jan 22, 2002
Shaking test apparatus and method for structures
HITACHI LTD33 citations92
US6234011B1May 22, 2001
Vehicle testing apparatus and method thereof
HITACHI LTD44 citations92
US6763311B2Jul 13, 2004
Shaking test apparatus and method for structures
HITACHI LTD5 citations73
US6629042B2Sep 30, 2003
Testing system and testing method for structure
HITACHI LTD6 citations73
US6397153B1May 28, 2002
Testing system and testing method for structure
HITACHI LTD10 citations73