Inventor
YUN JONG-HO
KR30 patents
⚠️ This page may combine multiple inventors who share the name “YUN JONG-HO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
25 patentsUS7432185B2Oct 7, 2008
Method of forming semiconductor device having stacked transistors
SAMSUNG ELECTRONICS CO LTD183 citations99
US7381989B2Jun 3, 2008
Semiconductor device including upper and lower transistors and interconnection between upper and lower transistors
SAMSUNG ELECTRONICS CO LTD182 citations99
US7687331B2Mar 30, 2010
Stacked semiconductor device and method of fabrication
SAMSUNG ELECTRONICS CO LTD54 citations98
US7214620B2May 8, 2007
Methods of forming silicide films with metal films in semiconductor devices and contacts including the same
SAMSUNG ELECTRONICS CO LTD26 citations92
US7842600B2Nov 30, 2010
Methods of forming interlayer dielectrics having air gaps
SAMSUNG ELECTRONICS CO LTD19 citations84
US7749840B2Jul 6, 2010
Methods of forming a semiconductor device including buried bit line
SAMSUNG ELECTRONICS CO LTD9 citations84
US7172967B2Feb 6, 2007
Methods for forming cobalt layers including introducing vaporized cobalt precursors and methods for manufacturing semiconductor devices using the same
SAMSUNG ELECTRONICS CO LTD19 citations84
US7846796B2Dec 7, 2010
Semiconductor devices including buried bit lines
SAMSUNG ELECTRONICS CO LTD6 citations74
US7833847B2Nov 16, 2010
Method of forming semiconductor device having stacked transistors
SAMSUNG ELECTRONICS CO LTD5 citations74
US7638433B2Dec 29, 2009
Semiconductor device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD7 citations74
US7435634B2Oct 14, 2008
Methods of forming semiconductor devices having stacked transistors
SAMSUNG ELECTRONICS CO LTD8 citations74
US11710715B2Jul 25, 2023
Semiconductor package
SAMSUNG ELECTRONICS CO LTD2 citations73
US7936024B2May 3, 2011
Semiconductor devices having stacked structures
SAMSUNG ELECTRONICS CO LTD3 citations63
US7416968B2Aug 26, 2008
Methods of forming field effect transistors having metal silicide gate electrodes
SAMSUNG ELECTRONICS CO LTD2 citations63
US7238612B2Jul 3, 2007
Methods of forming a double metal salicide layer and methods of fabricating semiconductor devices incorporating the same
SAMSUNG ELECTRONICS CO LTD2 citations62
US7560331B2Jul 14, 2009
Method for forming a silicided gate
SAMSUNG ELECTRONICS CO LTD2 citations59
US8044490B2Oct 25, 2011
Semiconductor device including fuse
SAMSUNG ELECTRONICS CO LTD1 citations52
US7666786B2Feb 23, 2010
Methods of fabricating semiconductor devices having a double metal salicide layer
SAMSUNG ELECTRONICS CO LTD0 citations52
US7662707B2Feb 16, 2010
Method of forming relatively continuous silicide layers for semiconductor devices
SAMSUNG ELECTRONICS CO LTD0 citations52
US7579225B2Aug 25, 2009
Method of forming semiconductor device having stacked transistors
SAMSUNG ELECTRONICS CO LTD0 citations52
US7531459B2May 12, 2009
Methods of forming self-aligned silicide layers using multiple thermal processes
SAMSUNG ELECTRONICS CO LTD0 citations52
US8021980B2Sep 20, 2011
Methods of manufacturing semiconductor devices including a copper-based conductive layer
SAMSUNG ELECTRONICS CO LTD1 citations51
US7867898B2Jan 11, 2011
Method forming ohmic contact layer and metal wiring in semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations42
US7312150B2Dec 25, 2007
Method of forming cobalt disilicide layer and method of manufacturing semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations42
US7569483B2Aug 4, 2009
Methods of forming metal silicide layers by annealing metal layers using inert heat transferring gases established in a convection apparatus
SAMSUNG ELECTRONICS CO LTD0 citations41