Inventor
ISOZAKI HISASHI
JP28 patents
⚠️ This page may combine multiple inventors who share the name “ISOZAKI HISASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
23 patentsUS6104481AAug 15, 2000
Surface inspection apparatus
TOPCON CORP113 citations95
US6654111B2Nov 25, 2003
Surface inspection apparatus and method
TOPCON CORP31 citations92
US6204918B1Mar 20, 2001
Apparatus for surface inspection
TOPCON CORP31 citations90
US7046353B2May 16, 2006
Surface inspection system
TOPCON CORP14 citations83
US6587192B2Jul 1, 2003
Surface inspecting apparatus and method
TOPCON CORP15 citations82
US10502630B2Dec 10, 2019
Temperature measurement device and temperature measurement method
TOPCON CORP2 citations73
US9719850B2Aug 1, 2017
Spatial light measuring method and spatial light measuring system
TOPCON CORP2 citations73
US6115117ASep 5, 2000
Method and apparatus for surface inspection
TOPCON CORP10 citations73
US6611328B2Aug 26, 2003
Surface inspecting apparatus and method
TOPCON CORP8 citations71
US9823354B2Nov 21, 2017
Illuminance measuring system
TOPCON CORP2 citations69
US8351115B2Jan 8, 2013
Complex type microscopic device
TOPCON CORP2 citations63
US6847444B2Jan 25, 2005
Surface inspecting apparatus and method
TOPCON CORP2 citations63
US7064820B2Jun 20, 2006
Surface inspection method and surface inspection system
TOPCON CORP6 citations61
US6771364B2Aug 3, 2004
Surface inspecting apparatus
TOPCON CORP6 citations61
US6941792B2Sep 13, 2005
Surface inspection system
TOPCON CORP1 citations52
US6331888B1Dec 18, 2001
Method and apparatus for surface inspection
TOPCON CORP0 citations52
US6108078AAug 22, 2000
Method and apparatus for surface inspection
TOPCON CORP1 citations52
US7245388B2Jul 17, 2007
Method and device for surface inspection
TOPCON CORP0 citations51
US10067233B2Sep 4, 2018
Illuminance measuring system
TOPCON CORP1 citations48
US8009286B2Aug 30, 2011
Surface inspecting method and device
TOPCON CORP1 citations48
US9952091B2Apr 24, 2018
Management system for illumination facility
TOPCON CORP0 citations41
US5814828ASep 29, 1998
Apparatus for defining the location of a foreign object on a rotary body in terms of a coordinate system
TOPCON CORP0 citations41
US7394532B2Jul 1, 2008
Surface inspection method and apparatus
TOPCON CORP0 citations38