Inventor
TANAKA AKINOBU
JP41 patents
⚠️ This page may combine multiple inventors who share the name “TANAKA AKINOBU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHINETSU CHEMICAL CO
14 patentsUS5612170AMar 18, 1997
Positive resist composition
SHINETSU CHEMICAL CO72 citations96
US5880169AMar 9, 1999
Sulfonium salts and chemically amplified positive resist compositions
SHINETSU CHEMICAL CO59 citations95
US8361693B2Jan 29, 2013
Chemically amplified positive photoresist composition and pattern forming process
SHINETSU CHEMICAL CO32 citations93
US5679496AOct 21, 1997
Chemically amplified positive resist composition
SHINETSU CHEMICAL CO28 citations92
US5624787AApr 29, 1997
Chemically amplified positive resist composition
SHINETSU CHEMICAL CO31 citations92
US5824824AOct 20, 1998
Sulfonium salts and chemically amplified positive resist compositions
SHINETSU CHEMICAL CO31 citations90
US5356753AOct 18, 1994
Positive resist material
SHINETSU CHEMICAL CO8 citations74
US6841334B2Jan 11, 2005
Onium salts and positive resist materials using the same
SHINETSU CHEMICAL CO6 citations73
US5629134AMay 13, 1997
Chemically amplified positive resist composition
SHINETSU CHEMICAL CO16 citations73
US5856561AJan 5, 1999
Bisphenol carboxylic acid tertiary ester derivatives and chemically amplified positive resist compositions
SHINETSU CHEMICAL CO11 citations72
US5512417AApr 30, 1996
Positive resist composition comprising a bis (t-butoxycarbonylmethly(thymolphthalein as a dissolution inhibitor
SHINETSU CHEMICAL CO14 citations72
US8361692B2Jan 29, 2013
Negative resist composition and patterning process using the same
SHINETSU CHEMICAL CO4 citations63
US6667415B1Dec 23, 2003
Tertiary butyl 4,4-bis(4′-hydroxyphenyl) pentanoate derivatives and positive resist materials containing the same
SHINETSU CHEMICAL CO2 citations63
US8828645B2Sep 9, 2014
Negative resist composition and patterning process
SHINETSU CHEMICAL CO1 citations52
NIPPON TELEGRAPH & TELEPHONE
6 patentsUS5457003AOct 10, 1995
Negative working resist material, method for the production of the same and process of forming resist patterns using the same
NIPPON TELEGRAPH & TELEPHONE59 citations96
US4702990AOct 27, 1987
Photosensitive resin composition and process for forming photo-resist pattern using the same
NIPPON TELEGRAPH & TELEPHONE32 citations92
US4507384AMar 26, 1985
Pattern forming material and method for forming pattern therewith
NIPPON TELEGRAPH & TELEPHONE27 citations92
US5158854AOct 27, 1992
Photosensitive and high energy beam sensitive resin composition containing substituted polysiloxane
NIPPON TELEGRAPH & TELEPHONE31 citations89
US4564579AJan 14, 1986
Pattern forming material of a siloxane polymer
NIPPON TELEGRAPH & TELEPHONE19 citations82
US4238385ADec 9, 1980
Coating composition for forming insulating film on electroconductive substrate for printed circuits and method therefor
NIPPON TELEGRAPH & TELEPHONE27 citations77
TANAKA AKINOBU
6 patentsUS8603724B2Dec 10, 2013
Negative resist composition and patterning process
TANAKA AKINOBU2 citations62
US8389201B2Mar 5, 2013
Positive resist composition and pattern forming process
TANAKA AKINOBU2 citations62
US8252518B2Aug 28, 2012
Chemically amplified positive resist composition and resist patterning process
TANAKA AKINOBU3 citations62
US8557509B2Oct 15, 2013
Negative resist composition, patterning process, and testing process and preparation process of negative resist composition
TANAKA AKINOBU1 citations51
US8470509B2Jun 25, 2013
Negative resist composition and patterning process
TANAKA AKINOBU0 citations41
US8394577B2Mar 12, 2013
Patterning process
TANAKA AKINOBU0 citations40
MASUNAGA KEIICHI
5 patentsUS8470511B2Jun 25, 2013
Chemically amplified negative resist composition for EB or EUV lithography and patterning process
MASUNAGA KEIICHI16 citations84
US8470512B2Jun 25, 2013
Polymer, chemically amplified negative resist composition, and patterning process
MASUNAGA KEIICHI10 citations84
US8426108B2Apr 23, 2013
Chemically amplified positive resist composition for EB or EUV lithography and patterning process
MASUNAGA KEIICHI13 citations84
US8288076B2Oct 16, 2012
Chemically amplified resist composition and pattern forming process
MASUNAGA KEIICHI12 citations84
US8546060B2Oct 1, 2013
Chemically amplified positive resist composition and pattern forming process
MASUNAGA KEIICHI0 citations41