Inventor
DOAN TRUNG TRI
US206 patents
⚠️ This page may combine multiple inventors who share the name “DOAN TRUNG TRI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
44 patentsUS7221059B2May 22, 2007
Wafer level semiconductor component having thinned, encapsulated dice and polymer dam
MICRON TECHNOLOGY INC61 citations99
US7029949B2Apr 18, 2006
Method for fabricating encapsulated semiconductor components having conductive vias
MICRON TECHNOLOGY INC141 citations99
US6964915B2Nov 15, 2005
Method of fabricating encapsulated semiconductor components by etching
MICRON TECHNOLOGY INC150 citations99
US6908784B1Jun 21, 2005
Method for fabricating encapsulated semiconductor components
MICRON TECHNOLOGY INC419 citations99
US6903442B2Jun 7, 2005
Semiconductor component having backside pin contacts
MICRON TECHNOLOGY INC168 citations99
US6828175B2Dec 7, 2004
Semiconductor component with backside contacts and method of fabrication
MICRON TECHNOLOGY INC248 citations99
US6683005B2Jan 27, 2004
Method of forming capacitor constructions
MICRON TECHNOLOGY INC92 citations99
US6573199B2Jun 3, 2003
Methods of treating dielectric materials with oxygen, and methods of forming capacitor constructions
MICRON TECHNOLOGY INC88 citations99
US6338667B2Jan 15, 2002
System for real-time control of semiconductor wafer polishing
MICRON TECHNOLOGY INC101 citations99
US6300219B1Oct 9, 2001
Method of forming trench isolation regions
MICRON TECHNOLOGY INC167 citations99
US6261151B1Jul 17, 2001
System for real-time control of semiconductor wafer polishing
MICRON TECHNOLOGY INC138 citations99
US5975994ANov 2, 1999
Method and apparatus for selectively conditioning a polished pad used in planarizng substrates
MICRON TECHNOLOGY INC182 citations99
US5851135ADec 22, 1998
System for real-time control of semiconductor wafer polishing
MICRON TECHNOLOGY INC238 citations99
US5842909ADec 1, 1998
System for real-time control of semiconductor wafer polishing including heater
MICRON TECHNOLOGY INC98 citations99
US5795218AAug 18, 1998
Polishing pad with elongated microcolumns
MICRON TECHNOLOGY INC153 citations99
US5777739AJul 7, 1998
Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers
MICRON TECHNOLOGY INC123 citations99
US5762537AJun 9, 1998
System for real-time control of semiconductor wafer polishing including heater
MICRON TECHNOLOGY INC133 citations99
US5730642AMar 24, 1998
System for real-time control of semiconductor wafer polishing including optical montoring
MICRON TECHNOLOGY INC424 citations99
US5700180ADec 23, 1997
System for real-time control of semiconductor wafer polishing
MICRON TECHNOLOGY INC223 citations99
US5658183AAug 19, 1997
System for real-time control of semiconductor wafer polishing including optical monitoring
MICRON TECHNOLOGY INC451 citations99
US5643060AJul 1, 1997
System for real-time control of semiconductor wafer polishing including heater
MICRON TECHNOLOGY INC193 citations99
US7432600B2Oct 7, 2008
System having semiconductor component with multiple stacked dice
MICRON TECHNOLOGY INC58 citations98
US7335994B2Feb 26, 2008
Semiconductor component having multiple stacked dice
MICRON TECHNOLOGY INC63 citations98
US6863725B2Mar 8, 2005
Method of forming a Ta2O5 comprising layer
MICRON TECHNOLOGY INC109 citations98
US5989470ANov 23, 1999
Method for making polishing pad with elongated microcolumns
MICRON TECHNOLOGY INC102 citations98
US5738562AApr 14, 1998
Apparatus and method for planar end-point detection during chemical-mechanical polishing
MICRON TECHNOLOGY INC149 citations98
US6120347ASep 19, 2000
System for real-time control of semiconductor wafer polishing
MICRON TECHNOLOGY INC61 citations97
US7417325B2Aug 26, 2008
Semiconductor component having thinned die with conductive vias configured as conductive pin terminal contacts
MICRON TECHNOLOGY INC33 citations96
US7388294B2Jun 17, 2008
Semiconductor components having stacked dice
MICRON TECHNOLOGY INC39 citations96
US7382060B2Jun 3, 2008
Semiconductor component having thinned die, polymer layers, contacts on opposing sides, and conductive vias connecting the contacts
MICRON TECHNOLOGY INC31 citations96
US7157353B2Jan 2, 2007
Method for fabricating encapsulated semiconductor components
MICRON TECHNOLOGY INC38 citations96
US7132731B2Nov 7, 2006
Semiconductor component and assembly having female conductive members
MICRON TECHNOLOGY INC48 citations96
US7081665B2Jul 25, 2006
Semiconductor component having thinned substrate, backside pin contacts and circuit side contacts
MICRON TECHNOLOGY INC44 citations96
US7078266B2Jul 18, 2006
Method for fabricating semiconductor components with thinned substrate, back side contacts and circuit side contacts
MICRON TECHNOLOGY INC56 citations96
US7001251B2Feb 21, 2006
Method and apparatus for releasably attaching a polishing pad to a chemical-mechanical planarization machine
MICRON TECHNOLOGY INC35 citations96
US6787401B2Sep 7, 2004
Method of making vertical diode structures
MICRON TECHNOLOGY INC33 citations96
US6720272B2Apr 13, 2004
Methods of forming capacitor constructions
MICRON TECHNOLOGY INC33 citations96
US6719012B2Apr 13, 2004
Method of forming trench isolation regions
MICRON TECHNOLOGY INC55 citations96
US6613702B2Sep 2, 2003
Methods of forming capacitor constructions
MICRON TECHNOLOGY INC68 citations96
US6583028B2Jun 24, 2003
Methods of forming trench isolation regions
MICRON TECHNOLOGY INC50 citations96
US6582281B2Jun 24, 2003
Semiconductor processing methods of removing conductive material
MICRON TECHNOLOGY INC49 citations96
US6537915B2Mar 25, 2003
Methods of treating surfaces of substrates
MICRON TECHNOLOGY INC36 citations96
US6464561B2Oct 15, 2002
System for real-time control of semiconductor wafer polishing
MICRON TECHNOLOGY INC26 citations96
US6306009B1Oct 23, 2001
System for real-time control of semiconductor wafer polishing
MICRON TECHNOLOGY INC25 citations96
SEMILEDS CORP
5 patentsUS7432119B2Oct 7, 2008
Light emitting diode with conducting metal substrate
SEMILEDS CORP56 citations98
US7646033B2Jan 12, 2010
Systems and methods for producing white-light light emitting diodes
SEMILEDS CORP53 citations97
US7195944B2Mar 27, 2007
Systems and methods for producing white-light emitting diodes
SEMILEDS CORP80 citations97
US7186580B2Mar 6, 2007
Light emitting diodes (LEDs) with improved light extraction by roughening
SEMILEDS CORP86 citations97
US7413918B2Aug 19, 2008
Method of making a light emitting diode
SEMILEDS CORP38 citations96
SEMILEDS OPTOELECTRONICS CO LT
1 patentShowing the top 50 of 206 patents by PatentIndex Score.