Inventor
GRUNDY DAVID C
US26 patents
⚠️ This page may combine multiple inventors who share the name “GRUNDY DAVID C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JENTEK SENSORS INC
19 patentsUS6995557B2Feb 7, 2006
High resolution inductive sensor arrays for material and defect characterization of welds
JENTEK SENSORS INC64 citations97
US6784662B2Aug 31, 2004
Eddy current sensor arrays having drive windings with extended portions
JENTEK SENSORS INC94 citations97
US6727691B2Apr 27, 2004
High resolution inductive sensor arrays for material and defect characterization of welds
JENTEK SENSORS INC67 citations95
US7696748B2Apr 13, 2010
Absolute property measurements using electromagnetic sensors
JENTEK SENSORS INC31 citations92
US7528598B2May 5, 2009
Fastener and fitting based sensing methods
JENTEK SENSORS INC27 citations92
US7526964B2May 5, 2009
Applied and residual stress measurements using magnetic field sensors
JENTEK SENSORS INC19 citations92
US7451657B2Nov 18, 2008
Material condition monitoring with multiple sensing modes
JENTEK SENSORS INC29 citations92
US7188532B2Mar 13, 2007
Self-monitoring metals, alloys and materials
JENTEK SENSORS INC20 citations92
US7183764B2Feb 27, 2007
Method for inspecting a channel using a flexible sensor
JENTEK SENSORS INC20 citations92
US7106055B2Sep 12, 2006
Fabrication of samples having predetermined material conditions
JENTEK SENSORS INC20 citations92
US7049811B2May 23, 2006
Test circuit having parallel drive segments and a plurality of sense elements
JENTEK SENSORS INC28 citations92
US7876094B2Jan 25, 2011
Magnetic field characterization of stresses and properties in materials
JENTEK SENSORS INC9 citations84
US7161351B2Jan 9, 2007
Hidden feature characterization using a database of sensor responses
JENTEK SENSORS INC16 citations84
US7095224B2Aug 22, 2006
Process control and damage monitoring
JENTEK SENSORS INC19 citations84
US7518360B2Apr 14, 2009
Hybrid wound/etched winding constructs for scanning and monitoring
JENTEK SENSORS INC11 citations82
US7280940B2Oct 9, 2007
Segmented field dielectric sensor array for material characterization
JENTEK SENSORS INC9 citations74
US7812601B2Oct 12, 2010
Material condition assessment with eddy current sensors
JENTEK SENSORS INC2 citations62
US9279784B2Mar 8, 2016
Durability enhanced and redundant embedded sensors
JENTEK SENSORS INC0 citations52
US7533575B2May 19, 2009
Quasistatic magnetic and electric field stress/strain gages
JENTEK SENSORS INC0 citations50
GOLDFINE NEIL J
5 patentsUS8494810B2Jul 23, 2013
Component adaptive life management
GOLDFINE NEIL J20 citations90
US8237433B2Aug 7, 2012
Magnetic field characterization of stresses and properties in materials
GOLDFINE NEIL J9 citations83
US8981018B2Mar 17, 2015
Internal material condition monitoring for control
GOLDFINE NEIL J4 citations72
US10001457B2Jun 19, 2018
Performance curve generation for non-destructive testing sensors
GOLDFINE NEIL J4 citations70
US8803515B2Aug 12, 2014
Durability enhanced and redundant embedded sensors
GOLDFINE NEIL J3 citations62
SHEIRETOV YANKO K
2 patentsUS8222897B2Jul 17, 2012
Test circuit with sense elements having associated and unassociated primary windings
SHEIRETOV YANKO K8 citations82
US8415947B2Apr 9, 2013
Method for stress assessment that removes temperature effects and hysteresis on the material property measurements
SHEIRETOV YANKO K2 citations60