Inventor · disambiguated record
Filipp V. Ignatovich
Also filed as: IGNATOVICH FILIPP · IGNATOVICH FILIPP V
13 granted patents·4 pending applications·102 citations·filing 2006–2024
91Inventor score
Top patents by PatentIndex Score
17 records- 0194US9019485B2Apparatus and method for evaluation of optical elementsLUMETRICS INC·Filed 2013·Granted Apr 28, 2015·14 cites·25 claims
- 0293US7528959B2Apparatus and method for sizing nanoparticles based on interferometric field detectionUNIV ROCHESTER·Filed 2008·Granted May 5, 2009·25 cites·8 claims
- 0389US10190977B2Method of measurement of multilayer structuresLUMETRICS INC·Filed 2017·Granted Jan 29, 2019·9 cites·14 claims
- 0484US8836778B2Portable fundus cameraIGNATOVICH FILIPP V·Filed 2010·Granted Sep 16, 2014·29 cites·12 claims
- 0579US7884946B2Apparatus for measurement of the axial length of an eyeLUMETRICS INC·Filed 2008·Granted Feb 8, 2011·10 cites·10 claims
- 0678US9448058B2Associated interferometers using multi-fiber optic delay linesLUMETRICS INC·Filed 2014·Granted Sep 20, 2016·4 cites·28 claims
- 0772US9958355B2Apparatus and method for evaluation of optical elementsLUMETRICS INC·Filed 2016·Granted May 1, 2018·1 cites·9 claims
- 0870US8279446B2Fiber-based interferometric device for measuring axial dimensions of a human eyeIGNATOVICH FILIPP V·Filed 2011·Granted Oct 2, 2012·4 cites·19 claims
- 0969US9341541B2Apparatus and method for evaluation of optical elementsLUMETRICS INC·Filed 2015·Granted May 17, 2016·1 cites·11 claims
- 1068US10006754B2Associated interferometers using multi-fiber optic delay linesLUMETRICS INC·Filed 2016·Granted Jun 26, 2018·1 cites·19 claims
- 1167US10761021B2Apparatus and method for measurement of multilayer structuresLUMETRICS INC·Filed 2018·Granted Sep 1, 2020·1 cites·24 claims
- 1267US8199329B2Apparatus for measurement of the axial length of an eyeBLALOCK TODD F·Filed 2010·Granted Jun 12, 2012·3 cites·5 claims
- 1362US2024311628A1LIRIC Diffractive Deep Neural NetworkCLERIO VISION INC·Filed 2024·Application pending·0 cites
- 1456US11215444B2Apparatus and method for measurement of multilayer structuresLUMETRICS INC·Filed 2020·Granted Jan 4, 2022·0 cites·17 claims
- 1550US2007030492A1Apparatus and method for sizing nanoparticles based on optical forces and interferometric field detectionNOVOTNY LUKAS·Filed 2006·Application pending·0 cites
- 1645US2009323061A1Multi-color hetereodyne interferometric apparatus and method for sizing nanoparticlesNOVOTNY LUKAS·Filed 2007·Application pending·0 cites
- 1744US2014267668A1Portable fundus cameraKLEINMAN DAVID M·Filed 2014·Application pending·0 cites
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