Inventor
FUKUDA TOMOHISA
JP8 patents
Patents
8 patentsUS8008633B2Aug 30, 2011
Specimen stage-moving device for charged-particle beam system
JEOL LTD10 citations80
US11953410B2Apr 9, 2024
Specimen support tool, support apparatus and specimen preparation method
JEOL LTD0 citations59
US11658000B2May 23, 2023
Sample support and method of fabricating same
JEOL LTD0 citations59
US12482629B2Nov 25, 2025
Specimen processing holder and specimen processing method
JEOL LTD0 citations54
US11679489B2Jun 20, 2023
Sample chip worktable and retainer
JEOL LTD0 citations54
US12253445B2Mar 18, 2025
Specimen pretreatment method
JEOL LTD0 citations48
US11037755B2Jun 15, 2021
Observation method, specimen support, and transmission electron microscope
JEOL LTD0 citations48
US10629407B2Apr 21, 2020
Charged particle beam device
JEOL LTD0 citations47