P

Inventor

BONAM RAVI K

US20 patents
⚠️ This page may combine multiple inventors who share the name “BONAM RAVI K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

19 patents
US9929012B1Mar 27, 2018

Resist having tuned interface hardmask layer for EUV exposure

IBM20 citations91
US11049844B2Jun 29, 2021

Semiconductor wafer having trenches with varied dimensions for multi-chip modules

IBM3 citations73
US10943883B1Mar 9, 2021

Planar wafer level fan-out of multi-chip modules having different size chips

IBM6 citations73
US10991635B2Apr 27, 2021

Multiple chip bridge connector

IBM2 citations72
US11887908B2Jan 30, 2024

Electronic package structure with offset stacked chips and top and bottom side cooling lid

IBM0 citations62
US11239167B2Feb 1, 2022

Cu—Cu bonding for interconnects on bridge chip attached to chips and packaging substrate

IBM0 citations62
US11081424B2Aug 3, 2021

Micro-fluidic channels having various critical dimensions

IBM0 citations62
US12086528B2Sep 10, 2024

Secure fingerprinting of a trusted photomask

IBM0 citations61
US11619877B2Apr 4, 2023

Determination of optical roughness in EUV structures

IBM0 citations61
US11480868B2Oct 25, 2022

Determination of optical roughness in EUV structures

IBM0 citations61
US11462512B2Oct 4, 2022

Three-dimensional microelectronic package with embedded cooling channels

IBM0 citations61
US10937764B2Mar 2, 2021

Three-dimensional microelectronic package with embedded cooling channels

IBM1 citations61
US11791270B2Oct 17, 2023

Direct bonded heterogeneous integration silicon bridge

IBM0 citations60
US10725454B2Jul 28, 2020

Mask process aware calibration using mask pattern fidelity inspections

IBM1 citations57
US9881762B2Jan 30, 2018

Integrated photoemission sources and scalable photoemission structures

IBM1 citations51
US9263228B2Feb 16, 2016

Integrated photoemission sources and scalable photoemission structures

IBM1 citations51
US10437951B2Oct 8, 2019

Care area generation by detection optimized methodology

IBM0 citations50
US10141188B2Nov 27, 2018

Resist having tuned interface hardmask layer for EUV exposure

IBM0 citations49
US10134592B2Nov 20, 2018

Resist having tuned interface hardmask layer for EUV exposure

IBM0 citations49

HARTLEY JOHN G

1 patent