Inventor

NISHIGUCHI KOHEI

JP10 patents

⚠️ This page may combine multiple inventors who share the name “NISHIGUCHI KOHEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

7 patents

US11881516B2Jan 23, 2024

Semiconductor element comprising a MIM capacitor and a via hole, a bottom of the via hole being placed between a rear surface of a source electrode and a rear surface of a barrier metal layer

MITSUBISHI ELECTRIC CORP0 citations60

US12451397B2Oct 21, 2025

IAS INC

2 patents

US11569081B2Jan 31, 2023

Method for analyzing metal fine particles, and inductively coupled plasma mass spectrometry method

IAS INC2 citations68

US12354862B2Jul 8, 2025

Method for analyzing metal microparticles, and inductively coupled plasma mass spectrometry method

IAS INC0 citations58

SUMITOMO SEIKA CHEMICALS

1 patent

US8020458B2Sep 20, 2011

Sample introducing system

SUMITOMO SEIKA CHEMICALS1 citations41

NISHIGUCHI KOHEI

MITSUBISHI ELECTRIC CORP

Semiconductor element comprising a MIM capacitor and a via hole, a bottom of the via hole being placed between a rear surface of a source electrode and a rear surface of a barrier metal layer

Semiconductor wafer and method for manufacturing semiconductor device

Method for manufacturing semiconductor device and semiconductor device

Semiconductor device manufacturing method

Method for manufacturing substrate for semiconductor device

Substrate for semiconductor device and method of manufacturing the same

Surface mount high-frequency circuit

IAS INC

Method for analyzing metal fine particles, and inductively coupled plasma mass spectrometry method

Method for analyzing metal microparticles, and inductively coupled plasma mass spectrometry method

SUMITOMO SEIKA CHEMICALS

Sample introducing system