P

Inventor

FANG YU-PIAO

TW16 patents

Patents

16 patents
US10658215B2May 19, 2020

Reticle transportation container

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations83
US11837486B2Dec 5, 2023

Reticle transportation container

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US11022889B2Jun 1, 2021

Overlay-shift measurement system and method for manufacturing semiconductor structure and measuring alignment mark of semiconductor structure

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US10962888B2Mar 30, 2021

Structures for acoustic wave overlay error determination using periodic structures

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10915017B2Feb 9, 2021

Multi-function overlay marks for reducing noise and extracting focus and critical dimension information

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10503082B2Dec 10, 2019

Optical reticle load port

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12189304B2Jan 7, 2025

Method and structures for acoustic wave overlay error determination

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12055860B2Aug 6, 2024

Multi-function overlay marks for reducing noise and extracting focus and critical dimension information

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11835864B2Dec 5, 2023

Multi-function overlay marks for reducing noise and extracting focus and critical dimension information

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11768443B2Sep 26, 2023

Method for manufacturing semiconductor structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11448975B2Sep 20, 2022

Multi-function overlay marks for reducing noise and extracting focus and critical dimension information

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11378892B2Jul 5, 2022

Overlay-shift measurement system

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11018037B2May 25, 2021

Optical reticle load port

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10998213B2May 4, 2021

Reticle transportation container

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10031412B1Jul 24, 2018

Pellicle assembly in photolithography process and method for using the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10497604B2Dec 3, 2019

Photomask transportation stage in semiconductor fabrication and method for using the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations37