Inventor

TAKEO HIDEYA

JP71 patents

⚠️ This page may combine multiple inventors who share the name “TAKEO HIDEYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAKEO HIDEYA

FUJI PHOTO FILM CO LTD

Medical network system

Apparatus for computer aided diagnosis of medical images having abnormal patterns

Method and apparatus for detecting prospective abnormal patterns

Image processing method and apparatus

Image processing method and apparatus

Prospective abnormal shadow detecting system, and method of and apparatus for judging whether prospective abnormal shadow is malignant or benignant

Abnormal pattern detection processing method and system

Method, apparatus and recording medium for data compression

Medical network system

Method, apparatus and recording medium for data transfer

Method for adjusting positions of radiation images

Image processing method and apparatus

Image processing method and apparatus

Method of forming energy subtraction images

Method and apparatus for detecting prospective abnormal patterns

Method for detecting abnormal patterns

Method for determining the orientation in which an object was placed when the image of the object was recorded

Method of automatically determining imaged body posture in medical image display

Method of automatically determining imaged body posture in medical image display

Method of determining orientation of image

Radiation image processing apparatus, determination apparatus, and radiation image read-out apparatus

Image processing system

Network system for medical images

Method and apparatus of image processing using energy substraction parameters according to thickness of an object

Method and apparatus for compressing dynamic ranges of images

Method and apparatus for adjusting read-out conditions and/or image

Method and system for detecting suspected anomalous shadows

Image storing method and image output system

Method, apparatus and recording medium for image decoding

Method, apparatus and recording medium for image processing

Abnormal pattern detection processing method and system and image display terminal

Method and apparatus for detecting prospective abnormal patterns

Image processing method and apparatus

Image processing method and apparatus

Method and apparatus for adjusting read-out conditions and/or image processing conditions for radiation images, radiation image read-out apparatus, and radiation image analyzing method and apparatus

Method and apparatus for adjusting read-out conditions and/or image processing conditions for radiation images , radiation image read-out apparatus, and radiation image analyzing method and apparatus

Method for detecting prospective abnormal patterns

Energy subtraction processing method and apparatus

Radiation image processing method utilizing neural networks

Method for adjusting read-out and processing conditions for Magen images

Method and apparatus for adjusting read-out and processing conditions for radiation images

Method for determining an image point in an object image

Method for judging the presence or absence of limited irradiation field

Method for recognizing an irradiation field, and method for judging the correctness or incorrectness of prospective contour points of an irradiation field

Method of recognizing irradiation field

Method for judging an irradiation field

Method for determining subdivision patterns of radiation images

Method of judging the correctness or incorrectness of a prospective contour point of an irradiation field

FUJIFILM CORP

Method and unit for suppressing a periodic pattern

Method and apparatus for detecting abnormal pattern candidates