Inventor · disambiguated record
Dong Su Park
Also filed as: PARK DONG S · PARK DONG-SU
29 granted patents·9 pending applications·291 citations·filing 1998–2022
96Inventor score
Files withHYNIX SEMICONDUCTOR INC22SK HYNIX INC5HYUNDAI ELECTRONICS IND4KOREA ELECTRIC POWER CORP3GACHON UNIV OF INDUSTRY-ACADEMIC COOPERATION FOUNDATION1
Top patents by PatentIndex Score
38 records- 0196US6303481B2Method for forming a gate insulating film for semiconductor devicesHYUNDAI ELECTRONICS IND·Filed 2000·Granted Oct 16, 2001·122 cites·24 claims
- 0285US6962856B2Method for forming device isolation film of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Nov 8, 2005·42 cites·11 claims
- 0384US10483265B2Semiconductor device and method for fabricating the sameSK HYNIX INC·Filed 2018·Granted Nov 19, 2019·2 cites·13 claims
- 0484US6551873B2Method for forming a tantalum oxide capacitorHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Apr 22, 2003·31 cites·10 claims
- 0583US7784357B2Creep tester for precision load control with weightKOREA ELECTRIC POWER CORP·Filed 2007·Granted Aug 31, 2010·8 cites·4 claims
- 0678US10734389B2Semiconductor device and method for fabricating the sameSK HYNIX INC·Filed 2019·Granted Aug 4, 2020·1 cites·7 claims
- 0775US10580777B2Semiconductor device and method for fabricating the sameSK HYNIX INC·Filed 2018·Granted Mar 3, 2020·1 cites·13 claims
- 0875US6597029B2Nonvolatile semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Jul 22, 2003·16 cites·7 claims
- 0972US11322501B2Semiconductor device and method for fabricating the sameSK HYNIX INC·Filed 2020·Granted May 3, 2022·0 cites·17 claims
- 1070US11217592B2Semiconductor device and method for fabricating the sameSK HYNIX INC·Filed 2020·Granted Jan 4, 2022·0 cites·9 claims
- 1170US6852136B2Method for manufacturing tantalum oxy nitride capacitorsHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Feb 8, 2005·15 cites·5 claims
- 1270US6656788B2Method for manufacturing a capacitor for semiconductor devicesHYUNDAI ELECTRONICS IND·Filed 2001·Granted Dec 2, 2003·14 cites·30 claims
- 1366US7713831B2Method for fabricating capacitor in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 11, 2010·3 cites·20 claims
- 1460US6825518B2Capacitor in semiconductor device and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Nov 30, 2004·7 cites·16 claims
- 1560US6337291B1Method of forming capacitor for semiconductor memory deviceHYUNDAI ELECTRONICS IND·Filed 2000·Granted Jan 8, 2002·7 cites·24 claims
- 1658US11826777B2Vibration-based coating layer surface modification method considering boundary layer thicknessGACHON UNIV OF INDUSTRY—ACADEMIC COOPERATION FOUNDATION·Filed 2022·Granted Nov 28, 2023·0 cites·10 claims
- 1755US7049248B2Method for manufacturing semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted May 23, 2006·4 cites·4 claims
- 1853US6955974B2Method for forming isolation layer of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Oct 18, 2005·5 cites·6 claims
- 1951US6964930B2Method of fabricating dielectric layerHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Nov 15, 2005·3 cites·17 claims
- 2051US6495414B2Method for manufacturing capacitor in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Dec 17, 2002·4 cites·16 claims
- 2149US6884678B2Method for forming capacitor of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Apr 26, 2005·2 cites·12 claims
- 2249US6461910B1Method of forming a capacitor in a semiconductor deviceHYUNDAI ELECTRONICS IND·Filed 2000·Granted Oct 8, 2002·3 cites·27 claims
- 2346US7084072B2Method of manufacturing semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Aug 1, 2006·1 cites·6 claims
- 2446US2010034632A1Method and apparatus for rotating heavy weight objectKOREA ELECTRIC POWER CORP·Filed 2008·Application pending·0 cites
- 2545US2008160699A1Method for Fabricating Semiconductor Device Having Bulb-Type Recessed ChannelHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 2644US2007264770A1Capacitor forming methodHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2744US2008242045A1Method for fabricating trench dielectric layer in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 2843US2008003751A1Methods for forming dual poly gate of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2943US2008070398A1Method For Fabricating Semiconductor Device Having Metal FuseHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 3042US7745323B2Metal interconnection of a semiconductor device and method of fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Jun 29, 2010·0 cites·5 claims
- 3141US6815225B2Method for forming capacitor of nonvolatile semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Nov 9, 2004·0 cites·16 claims
- 3238US9063830B2Micro-SD device loaded with a smart cardSK C&C CO LTD·Filed 2012·Granted Jun 23, 2015·0 cites·7 claims
- 3338US7153739B2Method for manufacturing a capacitor of a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Dec 26, 2006·0 cites·11 claims
- 3438US6913963B2Method for fabricating capacitor in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Jul 5, 2005·0 cites·13 claims
- 3537US2005006690A1Capacitor of semiconductor device and method for fabricating the sameFiled 2003·Application pending·0 cites
- 3637US2003003649A1Method for forming a capacitor of a semiconductor deviceFiled 2002·Application pending·0 cites
- 3736US2005272210A1Method for manufacturing gate electrode of semiconductor device using aluminium nitride filmHYNIX SEMICONDUCTOR INC·Filed 2004·Application pending·0 cites
- 3822US6016708AExisting strain measuring apparatus for analyzing stability of steel structure and method thereofKOREA ELECTRIC POWER CORP·Filed 1998·Granted Jan 25, 2000·0 cites·5 claims
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