P

Inventor

HOLZAPFEL WOLFGANG

DE120 patents
⚠️ This page may combine multiple inventors who share the name “HOLZAPFEL WOLFGANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HEIDENHAIN GMBH DR JOHANNES

41 patents
US6198534B1Mar 6, 2001

Scanning unit for an optical position measuring system

HEIDENHAIN GMBH DR JOHANNES55 citations96
US6605828B1Aug 12, 2003

Optoelectronic component with a space kept free from underfiller

HEIDENHAIN GMBH DR JOHANNES61 citations94
US7907286B2Mar 15, 2011

Optical position-measuring device

HEIDENHAIN GMBH DR JOHANNES17 citations93
US7573581B2Aug 11, 2009

Position-measuring device

HEIDENHAIN GMBH DR JOHANNES38 citations93
US6885457B1Apr 26, 2005

Rotary position measuring system

HEIDENHAIN GMBH DR JOHANNES33 citations93
US6392224B1May 21, 2002

Scanning unit for an optical position measuring device

HEIDENHAIN GMBH DR JOHANNES57 citations93
US5994692ANov 30, 1999

Photo-electric position measuring system having a scanning grating with transverse graduations

HEIDENHAIN GMBH DR JOHANNES51 citations93
US5814812ASep 29, 1998

Device for filtering of harmonic signal components

HEIDENHAIN GMBH DR JOHANNES21 citations93
US5739911AApr 14, 1998

Position measuring system

HEIDENHAIN GMBH DR JOHANNES21 citations93
US5648658AJul 15, 1997

Apparatus and method for generating position-dependent signals using a scanning plate having a plurality of differently configured scanning regions

HEIDENHAIN GMBH DR JOHANNES32 citations93
US5576537ANov 19, 1996

Photoelectric position measuring system using gratings having specified dimensions to suppress harmonics

HEIDENHAIN GMBH DR JOHANNES43 citations93
US5428445AJun 27, 1995

Interferential position measuring device

HEIDENHAIN GMBH DR JOHANNES47 citations93
US6603114B1Aug 5, 2003

Scanning head comprising a semiconductor substrate with a blind hole containing a light source

HEIDENHAIN GMBH DR JOHANNES34 citations92
US6472658B2Oct 29, 2002

Photoelectric position measuring system that optimizes modulation of a scanning device and the intensity of a reference mark signal

HEIDENHAIN GMBH DR JOHANNES31 citations92
US6470577B1Oct 29, 2002

Angle measuring system and use of this angle measuring system in a spindle arrangement

HEIDENHAIN GMBH DR JOHANNES19 citations92
US6175414B1Jan 16, 2001

Optical position measuring device

HEIDENHAIN GMBH DR JOHANNES30 citations92
US5977539ANov 2, 1999

Optical position-measuring device having reference mark graduation structures with chirp fields

HEIDENHAIN GMBH DR JOHANNES44 citations92
US5956659ASep 21, 1999

Arrangement and method for the automatic correction of error-containing scanning signals of incremental position-measuring devices

HEIDENHAIN GMBH DR JOHANNES52 citations92
US6528779B1Mar 4, 2003

Optoelectronic module

HEIDENHAIN GMBH DR JOHANNES47 citations91
US5973620AOct 26, 1999

Control device and process for testing position dependent signals of a position measuring device

HEIDENHAIN GMBH DR JOHANNES28 citations91
US5883298AMar 16, 1999

Control device and process for testing position-dependent signals of a position measuring device

HEIDENHAIN GMBH DR JOHANNES26 citations91
US7019842B2Mar 28, 2006

Position measuring device

HEIDENHAIN GMBH DR JOHANNES45 citations90
US6097490AAug 1, 2000

Optical position measuring instrument for generating a reference pulse signal

HEIDENHAIN GMBH DR JOHANNES28 citations89
US6452159B2Sep 17, 2002

Position measuring system

HEIDENHAIN GMBH DR JOHANNES31 citations87
US7858922B2Dec 28, 2010

Position-measuring device

HEIDENHAIN GMBH DR JOHANNES16 citations84
US7796272B2Sep 14, 2010

Position-measuring device for measuring a position of an object relative to a tool having a tool centerpoint

HEIDENHAIN GMBH DR JOHANNES11 citations84
US7549234B2Jun 23, 2009

Method for mounting a scale on a support and arrangement with a support and a scale

HEIDENHAIN GMBH DR JOHANNES10 citations84
US7471397B2Dec 30, 2008

Position-measuring device

HEIDENHAIN GMBH DR JOHANNES16 citations84
US7268883B2Sep 11, 2007

Optoelectronic harmonically filtered detector system for a scanning unit

HEIDENHAIN GMBH DR JOHANNES11 citations84
US7710578B2May 4, 2010

Position measuring arrangement

HEIDENHAIN GMBH DR JOHANNES15 citations83
US7154609B2Dec 26, 2006

Interferential position measuring arrangement

HEIDENHAIN GMBH DR JOHANNES12 citations83
US6995836B1Feb 7, 2006

Angle measuring system

HEIDENHAIN GMBH DR JOHANNES13 citations83
US6977368B2Dec 20, 2005

Method for measuring position and position measuring device for carrying out said method

HEIDENHAIN GMBH DR JOHANNES12 citations82
US6526190B2Feb 25, 2003

Position measuring system

HEIDENHAIN GMBH DR JOHANNES18 citations82
US6519044B1Feb 11, 2003

Scanner unit for an optical position measuring device

HEIDENHAIN GMBH DR JOHANNES15 citations82
US7348546B2Mar 25, 2008

Position measuring system with a scanning unit having a reference pulse signal detection unit

HEIDENHAIN GMBH DR JOHANNES15 citations81
US5874729AFeb 23, 1999

Device for filtering odd-numbered harmonic signal components

HEIDENHAIN GMBH DR JOHANNES14 citations74
US5583798ADec 10, 1996

Position measuring method and apparatus for generating periodic signals free of harmonics

HEIDENHAIN GMBH DR JOHANNES16 citations74
US6043482AMar 28, 2000

Scanning unit with a printed circuit for an optical position-measuring apparatus

HEIDENHAIN GMBH DR JOHANNES14 citations72
US7707739B2May 4, 2010

Method for attaching a scale to a carrier, a scale, and carrier having a scale

HEIDENHAIN GMBH DR JOHANNES6 citations71
US6497049B1Dec 24, 2002

Optical position-measuring device

HEIDENHAIN GMBH DR JOHANNES7 citations71

JOHANNAS HEIDENHAIN GMBH DR

2 patents

HOLZAPFEL WOLFGANG

2 patents

HONEYWELL INC

1 patent

HONEYWELL GMBH

1 patent

JOHANNES HIEDENHEIN GMBH DR

1 patent

JOHANNAS HEIDENHAM GMBH

1 patent

RATIONAL AG

1 patent

Showing the top 50 of 120 patents by PatentIndex Score.