P

Inventor

OHSAWA YOUICHI

JP89 patents
⚠️ This page may combine multiple inventors who share the name “OHSAWA YOUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHINETSU CHEMICAL CO

34 patents
US7569326B2Aug 4, 2009

Sulfonium salt having polymerizable anion, polymer, resist composition, and patterning process

SHINETSU CHEMICAL CO129 citations98
US6916591B2Jul 12, 2005

Photoacid generators, chemically amplified resist compositions, and patterning process

SHINETSU CHEMICAL CO79 citations98
US7511169B2Mar 31, 2009

Sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO45 citations96
US6673511B1Jan 6, 2004

Resist composition

SHINETSU CHEMICAL CO48 citations96
US6440634B1Aug 27, 2002

Onium salts, photoacid generators for resist compositions, resist compositions, and patterning process

SHINETSU CHEMICAL CO76 citations96
US8361693B2Jan 29, 2013

Chemically amplified positive photoresist composition and pattern forming process

SHINETSU CHEMICAL CO32 citations93
US8048610B2Nov 1, 2011

Sulfonium salt-containing polymer, resist composition, and patterning process

SHINETSU CHEMICAL CO32 citations93
US7919226B2Apr 5, 2011

Sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO19 citations93
US7670751B2Mar 2, 2010

Photoacid generator, resist composition, and patterning process

SHINETSU CHEMICAL CO26 citations93
US7569324B2Aug 4, 2009

Sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO18 citations93
US7527912B2May 5, 2009

Photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO38 citations93
US7514202B2Apr 7, 2009

Thermal acid generator, resist undercoat material and patterning process

SHINETSU CHEMICAL CO37 citations93
US7459261B2Dec 2, 2008

Resist composition and patterning process using the same

SHINETSU CHEMICAL CO28 citations93
US7090961B2Aug 15, 2006

Photo acid generator, chemical amplification resist material and pattern formation method

SHINETSU CHEMICAL CO18 citations93
US6916593B2Jul 12, 2005

Resist composition

SHINETSU CHEMICAL CO33 citations93
US6692893B2Feb 17, 2004

Onium salts, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO29 citations93
US6551758B2Apr 22, 2003

Onium salts, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO25 citations93
US6420085B1Jul 16, 2002

Resist compositions and patterning process

SHINETSU CHEMICAL CO22 citations93
US6416928B1Jul 9, 2002

Onium salts, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO41 citations93
US6338931B1Jan 15, 2002

Resist compositions and patterning process

SHINETSU CHEMICAL CO35 citations93
US6689530B2Feb 10, 2004

Sulfonyldiazomethanes, photoacid generations, resist compositions, and patterning process

SHINETSU CHEMICAL CO21 citations92
US6395446B1May 28, 2002

Resist compositions and patterning process

SHINETSU CHEMICAL CO24 citations92
US5847218ADec 8, 1998

Sulfonium salts and chemically amplified positive resist compositions

SHINETSU CHEMICAL CO39 citations92
US5679496AOct 21, 1997

Chemically amplified positive resist composition

SHINETSU CHEMICAL CO28 citations92
US5569784AOct 29, 1996

Sulfonium salt and resist composition

SHINETSU CHEMICAL CO29 citations92
US8349533B2Jan 8, 2013

Resist lower-layer composition containing thermal acid generator, resist lower layer film-formed substrate, and patterning process

SHINETSU CHEMICAL CO14 citations84
US8039198B2Oct 18, 2011

Sulfonium salt-containing polymer, resist composition, and patterning process

SHINETSU CHEMICAL CO12 citations84
US7977027B2Jul 12, 2011

Resist composition and patterning process

SHINETSU CHEMICAL CO15 citations84
US7629108B2Dec 8, 2009

Nitrogen-containing organic compound, resist composition and patterning process

SHINETSU CHEMICAL CO16 citations84
US7556909B2Jul 7, 2009

Sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO9 citations84
US7531290B2May 12, 2009

Sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO17 citations84
US7312016B2Dec 25, 2007

Chemically amplified positive resist composition and patterning process

SHINETSU CHEMICAL CO11 citations84
US6541179B2Apr 1, 2003

Resist compositions and patterning process

SHINETSU CHEMICAL CO13 citations84
US6156481ADec 5, 2000

Positive resist composition

SHINETSU CHEMICAL CO17 citations84

OHASHI MASAKI

5 patents

OHSAWA YOUICHI

5 patents

KOBAYASHI TOMOHIRO

2 patents

HATAKEYAMA JUN

2 patents

MASUNAGA KEIICHI

1 patent

TAKEDA TAKANOBU

1 patent

Showing the top 50 of 89 patents by PatentIndex Score.