Inventor

DREGE EMMANUEL

US18 patents

⚠️ This page may combine multiple inventors who share the name “DREGE EMMANUEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DREGE EMMANUEL

TIMBRE TECH INC

Model and parameter selection for optical metrology

Optical metrology model optimization based on goals

Edge roughness measurement in optical metrology

Metrology hardware adaptation with universal library

Selection of wavelengths for integrated circuit optical metrology

Integrated circuit profile value determination

Selecting a hypothetical profile to use in optical metrology

Model and parameter selection for optical metrology

Selection of wavelengths for integrated circuit optical metrology

TOKYO ELECTRON LTD

Optical metrology of structures formed on semiconductor wafers using machine learning systems

Optical metrology model optimization based on goals

Selecting a profile model for use in optical metrology using a machine learning system

CHAN KEVIN

Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing

Method and system for process optimization

Method and system for mask optimization

CADENCE DESIGN SYSTEMS INC

Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing

Method and system for inspection optimization in design and production of integrated circuits

LEE BRIAN

Methods, systems, and computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit design