Inventor
KIM SEOK JIN
KR29 patents
⚠️ This page may combine multiple inventors who share the name “KIM SEOK JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LG CHEMICAL LTD
8 patentsUS11196031B2Dec 7, 2021
Electrode, method for manufacturing the electrode, and roller for manufacturing the electrode
LG CHEMICAL LTD3 citations73
US11761927B2Sep 19, 2023
Inspection method for crack in battery cell by using eddy current, and inspection device
LG CHEMICAL LTD3 citations72
US11342576B2May 24, 2022
Electrode assembly and method for manufacturing the same
LG CHEMICAL LTD0 citations51
US11522258B2Dec 6, 2022
Electrolyte removing device, apparatus and method for manufacturing secondary battery comprising the same, and secondary battery
LG CHEMICAL LTD0 citations50
US10957943B2Mar 23, 2021
Jig device for inspecting quality of secondary battery
LG CHEMICAL LTD0 citations50
US10921294B2Feb 16, 2021
System for non-destructively inspecting and determining sealing of aluminum pouch by using ultrasonic waves
LG CHEMICAL LTD0 citations50
US10826039B2Nov 3, 2020
Electrode assembly including electrode and separator partially bonded to each other
LG CHEMICAL LTD0 citations50
US10249902B2Apr 2, 2019
Secondary battery transfer device and method for detecting receipt failure of secondary battery
LG CHEMICAL LTD0 citations48
LG ENERGY SOLUTION LTD
5 patentsUS12569938B2Mar 10, 2026
Device and method for inspecting welded state
LG ENERGY SOLUTION LTD0 citations52
US12584875B2Mar 24, 2026
Device and method for inspecting welded state for cylindrical secondary battery
LG ENERGY SOLUTION LTD0 citations51
US12174137B2Dec 24, 2024
Welding quality inspection device
LG ENERGY SOLUTION LTD0 citations51
US12025578B2Jul 2, 2024
Welding failure inspection method
LG ENERGY SOLUTION LTD0 citations51
US12000795B2Jun 4, 2024
Eddy current sensor having improved crack detection capability, and eddy current inspection device including same
LG ENERGY SOLUTION LTD0 citations51
CHEIL IND INC
4 patentsUS6447694B1Sep 10, 2002
Composition for chemical mechanical polishing
CHEIL IND INC26 citations92
US6364919B1Apr 2, 2002
Process for preparing metal oxide slurries suitable for the chemical mechanical polishing of semiconductors
CHEIL IND INC15 citations83
US6551367B2Apr 22, 2003
Process for preparing metal oxide slurry suitable for semiconductor chemical mechanical polishing
CHEIL IND INC12 citations73
US6488730B2Dec 3, 2002
Polishing composition
CHEIL IND INC11 citations73