Inventor
TOSHIYUKI KIYOKAWA
JP12 patents
Patents
12 patentsUS11567119B2Jan 31, 2023
Testing system including active thermal interposer device
ADVANTEST TEST SOLUTIONS INC10 citations93
US11674999B2Jun 13, 2023
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC10 citations85
US11754620B2Sep 12, 2023
DUT placement and handling for active thermal interposer device
ADVANTEST TEST SOLUTIONS INC2 citations72
US12540968B2Feb 3, 2026
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12540967B2Feb 3, 2026
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12535522B2Jan 27, 2026
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12320841B2Jun 3, 2025
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12216154B2Feb 4, 2025
Active thermal interposer device
ADVANTEST TEST SOLUTIONS INC0 citations62
US11846669B2Dec 19, 2023
Active thermal interposer device
ADVANTEST TEST SOLUTIONS INC0 citations62
US11609266B2Mar 21, 2023
Active thermal interposer device
ADVANTEST TEST SOLUTIONS INC0 citations62
US11774492B2Oct 3, 2023
Test system including active thermal interposer device
ADVANTEST TEST SOLUTIONS INC0 citations61
US12235314B2Feb 25, 2025
Parallel test cell with self actuated sockets
ADVANTEST TEST SOLUTIONS INC0 citations60