Inventor
KU WUN-YE
TW5 patents
Patents
5 patentsUS11486899B2Nov 1, 2022
Wafer test system and methods thereof
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Wafer inspection system method
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Wafer inspection system
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US12253473B2Mar 18, 2025
Electronic system of specimen qualification
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US12019032B2Jun 25, 2024
Electronic system and method of specimen qualification
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